Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer

Title: Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer

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Abstract

This paper describes a method for preparing the sample handling and inlet system of a mass spectrometer for analysis of a subsequent sample following analysis of a previous sample comprising the flushing of the system interior with supercritical CO{sub 2} and venting the interior. The method eliminates the effect of system ``memory`` on the subsequent analysis, especially following persistent samples such as xenon and krypton.

Inventors:: Chastgner, P.

Issue Date:: 1991-05-08

Research Org.:: Westinghouse Savannah River Co., Aiken, SC (United States)

Sponsoring Org.:: USDOE, Washington, DC (United States)

OSTI Identifier:: 10147636

Patent Number(s):: -US-A7697042

Application Number:: ON: DE93012004; PAN: 7-697,042

Assignee:: Dept. of Energy SRS; SCA: 400102; 440800; PA: EDB-93:070881; NTS-93:016676; ERA-18:021075; SN: 93000971762

DOE Contract Number:: AC09-89SR18035

Resource Type:: Patent

Resource Relation:: Other Information: PBD: 8 May 1991

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION; MASS SPECTROMETERS; VENTILATION; INVENTIONS; CARBON DIOXIDE; DESIGN; SAMPLING; 400102; 440800; CHEMICAL AND SPECTRAL PROCEDURES; MISCELLANEOUS INSTRUMENTATION

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                    Chastgner, P. Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer.  United States: N. p., 1991. 
        Web.

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                    Chastgner, P. Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer.  United States.

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                    Chastgner, P. Wed .  
        "Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer".  United States.  https://www.osti.gov/servlets/purl/10147636.

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@article{osti_10147636,

  title        = {Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer},

  author       = {Chastgner, P.},

  abstractNote = {This paper describes a method for preparing the sample handling and inlet system of a mass spectrometer for analysis of a subsequent sample following analysis of a previous sample comprising the flushing of the system interior with supercritical CO{sub 2} and venting the interior. The method eliminates the effect of system ``memory`` on the subsequent analysis, especially following persistent samples such as xenon and krypton.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1991},

  month        = {5}

}

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