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Title: Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer

Abstract

This paper describes a method for preparing the sample handling and inlet system of a mass spectrometer for analysis of a subsequent sample following analysis of a previous sample comprising the flushing of the system interior with supercritical CO{sub 2} and venting the interior. The method eliminates the effect of system ``memory`` on the subsequent analysis, especially following persistent samples such as xenon and krypton.

Inventors:
Issue Date:
Research Org.:
Westinghouse Savannah River Co., Aiken, SC (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
10147636
Patent Number(s):
-US-A7697042
Application Number:
ON: DE93012004; PAN: 7-697,042
Assignee:
Dept. of Energy SRS; SCA: 400102; 440800; PA: EDB-93:070881; NTS-93:016676; ERA-18:021075; SN: 93000971762
DOE Contract Number:  
AC09-89SR18035
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 8 May 1991
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION; MASS SPECTROMETERS; VENTILATION; INVENTIONS; CARBON DIOXIDE; DESIGN; SAMPLING; 400102; 440800; CHEMICAL AND SPECTRAL PROCEDURES; MISCELLANEOUS INSTRUMENTATION

Citation Formats

Chastgner, P. Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer. United States: N. p., 1991. Web.
Chastgner, P. Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer. United States.
Chastgner, P. Wed . "Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer". United States. https://www.osti.gov/servlets/purl/10147636.
@article{osti_10147636,
title = {Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer},
author = {Chastgner, P.},
abstractNote = {This paper describes a method for preparing the sample handling and inlet system of a mass spectrometer for analysis of a subsequent sample following analysis of a previous sample comprising the flushing of the system interior with supercritical CO{sub 2} and venting the interior. The method eliminates the effect of system ``memory`` on the subsequent analysis, especially following persistent samples such as xenon and krypton.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1991},
month = {5}
}