Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer
Abstract
This paper describes a method for preparing the sample handling and inlet system of a mass spectrometer for analysis of a subsequent sample following analysis of a previous sample comprising the flushing of the system interior with supercritical CO{sub 2} and venting the interior. The method eliminates the effect of system ``memory`` on the subsequent analysis, especially following persistent samples such as xenon and krypton.
- Inventors:
- Issue Date:
- Research Org.:
- Westinghouse Savannah River Co., Aiken, SC (United States)
- Sponsoring Org.:
- USDOE, Washington, DC (United States)
- OSTI Identifier:
- 10147636
- Patent Number(s):
- 7697042
- Application Number:
- ON: DE93012004; PAN: 7-697,042
- Assignee:
- Dept. of Energy
- Patent Classifications (CPCs):
-
H - ELECTRICITY H04 - ELECTRIC COMMUNICATION TECHNIQUE H04N - PICTORIAL COMMUNICATION, e.g. TELEVISION
- DOE Contract Number:
- AC09-89SR18035
- Resource Type:
- Patent
- Resource Relation:
- Other Information: PBD: 8 May 1991
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION; MASS SPECTROMETERS; VENTILATION; INVENTIONS; CARBON DIOXIDE; DESIGN; SAMPLING; 400102; 440800; CHEMICAL AND SPECTRAL PROCEDURES; MISCELLANEOUS INSTRUMENTATION
Citation Formats
Chastgner, P. Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer. United States: N. p., 1991.
Web.
Chastgner, P. Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer. United States.
Chastgner, P. Wed .
"Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer". United States. https://www.osti.gov/servlets/purl/10147636.
@article{osti_10147636,
title = {Elimination of ``memory`` from sample handling and inlet system of a mass spectrometer},
author = {Chastgner, P},
abstractNote = {This paper describes a method for preparing the sample handling and inlet system of a mass spectrometer for analysis of a subsequent sample following analysis of a previous sample comprising the flushing of the system interior with supercritical CO{sub 2} and venting the interior. The method eliminates the effect of system ``memory`` on the subsequent analysis, especially following persistent samples such as xenon and krypton.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1991},
month = {5}
}
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