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Title: Cross-ontological analytics for alignment of different classification schemes

Abstract

Quantification of the similarity between nodes in multiple electronic classification schemes is provided by automatically identifying relationships and similarities between nodes within and across the electronic classification schemes. Quantifying the similarity between a first node in a first electronic classification scheme and a second node in a second electronic classification scheme involves finding a third node in the first electronic classification scheme, wherein a first product value of an inter-scheme similarity value between the second and third nodes and an intra-scheme similarity value between the first and third nodes is a maximum. A fourth node in the second electronic classification scheme can be found, wherein a second product value of an inter-scheme similarity value between the first and fourth nodes and an intra-scheme similarity value between the second and fourth nodes is a maximum. The maximum between the first and second product values represents a measure of similarity between the first and second nodes.

Inventors:
 [1];  [2];  [3];  [2];  [2]
  1. (Seattle, WA)
  2. (Richland, WA)
  3. (Cleveland, OH)
Issue Date:
Research Org.:
Posse, Christian (Seattle, WA); Sanfilippo, Antonio P (Richland, WA); Gopalan, Banu (Cleveland, OH); Riensche, Roderick M (Richland, WA); Baddeley, Robert L (Richland, WA)
Sponsoring Org.:
USDOE
OSTI Identifier:
1014553
Patent Number(s):
7,805,010
Application Number:
US Patent Application 11/493,503
Assignee:
Posse, Christian (Seattle, WA); Sanfilippo, Antonio P (Richland, WA); Gopalan, Banu (Cleveland, OH); Riensche, Roderick M (Richland, WA); Baddeley, Robert L (Richland, WA) RLO
DOE Contract Number:  
AC05-76RLO1830
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Posse, Christian, Sanfilippo, Antonio P, Gopalan, Banu, Riensche, Roderick M, and Baddeley, Robert L. Cross-ontological analytics for alignment of different classification schemes. United States: N. p., 2010. Web.
Posse, Christian, Sanfilippo, Antonio P, Gopalan, Banu, Riensche, Roderick M, & Baddeley, Robert L. Cross-ontological analytics for alignment of different classification schemes. United States.
Posse, Christian, Sanfilippo, Antonio P, Gopalan, Banu, Riensche, Roderick M, and Baddeley, Robert L. Tue . "Cross-ontological analytics for alignment of different classification schemes". United States. https://www.osti.gov/servlets/purl/1014553.
@article{osti_1014553,
title = {Cross-ontological analytics for alignment of different classification schemes},
author = {Posse, Christian and Sanfilippo, Antonio P and Gopalan, Banu and Riensche, Roderick M and Baddeley, Robert L},
abstractNote = {Quantification of the similarity between nodes in multiple electronic classification schemes is provided by automatically identifying relationships and similarities between nodes within and across the electronic classification schemes. Quantifying the similarity between a first node in a first electronic classification scheme and a second node in a second electronic classification scheme involves finding a third node in the first electronic classification scheme, wherein a first product value of an inter-scheme similarity value between the second and third nodes and an intra-scheme similarity value between the first and third nodes is a maximum. A fourth node in the second electronic classification scheme can be found, wherein a second product value of an inter-scheme similarity value between the first and fourth nodes and an intra-scheme similarity value between the second and fourth nodes is a maximum. The maximum between the first and second product values represents a measure of similarity between the first and second nodes.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2010},
month = {9}
}

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