High-temperature thermocouples and related methods
Abstract
A high-temperature thermocouple and methods for fabricating a thermocouple capable of long-term operation in high-temperature, hostile environments without significant signal degradation or shortened thermocouple lifetime due to heat induced brittleness.
- Inventors:
-
- Idaho Falls, ID
- Firth, ID
- Issue Date:
- Research Org.:
- Idaho National Lab. (INL), Idaho Falls, ID (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1013389
- Patent Number(s):
- 7871198
- Application Number:
- 11/678,901
- Assignee:
- Battelle Energy Alliance, LLC (Idaho Falls, ID)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
- DOE Contract Number:
- AC07-05ID14517
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Rempe, Joy L, Knudson, Darrell L, Condie, Keith G, and Wilkins, S Curt. High-temperature thermocouples and related methods. United States: N. p., 2011.
Web.
Rempe, Joy L, Knudson, Darrell L, Condie, Keith G, & Wilkins, S Curt. High-temperature thermocouples and related methods. United States.
Rempe, Joy L, Knudson, Darrell L, Condie, Keith G, and Wilkins, S Curt. Tue .
"High-temperature thermocouples and related methods". United States. https://www.osti.gov/servlets/purl/1013389.
@article{osti_1013389,
title = {High-temperature thermocouples and related methods},
author = {Rempe, Joy L and Knudson, Darrell L and Condie, Keith G and Wilkins, S Curt},
abstractNote = {A high-temperature thermocouple and methods for fabricating a thermocouple capable of long-term operation in high-temperature, hostile environments without significant signal degradation or shortened thermocouple lifetime due to heat induced brittleness.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {1}
}
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Works referenced in this record:
Thermocouples for High-Temperature In-Pile Testing
journal, December 2006
- Rempe, J. L.; Knudson, D. L.; Condie, K. G.
- Nuclear Technology, Vol. 156, Issue 3