Surface property detection apparatus and method
Abstract
Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor. 4 figs.
- Inventors:
- Issue Date:
- Research Org.:
- AT&T
- OSTI Identifier:
- 101000
- Patent Number(s):
- 5440238
- Application Number:
- PAN: 7-948,535
- Assignee:
- Sandia Corp., Albuquerque, NM (United States)
- DOE Contract Number:
- AC04-76DP00789
- Resource Type:
- Patent
- Resource Relation:
- Other Information: PBD: 8 Aug 1995
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; 36 MATERIALS SCIENCE; SUPERCONDUCTORS; NONDESTRUCTIVE TESTING; ELECTRIC CONDUCTIVITY; CORROSION; ELECTRIC CONDUCTORS; DIELECTRIC MATERIALS; SEMICONDUCTOR MATERIALS; CRYSTAL GROWTH; OXIDES; CORROSION PRODUCTS; MICROWAVE EQUIPMENT; IMAGES; SURFACE PROPERTIES; DETECTION; MEASURING INSTRUMENTS; DESIGN
Citation Formats
Martens, J S, Ginley, D S, Hietala, V M, and Sorensen, N R. Surface property detection apparatus and method. United States: N. p., 1995.
Web.
Martens, J S, Ginley, D S, Hietala, V M, & Sorensen, N R. Surface property detection apparatus and method. United States.
Martens, J S, Ginley, D S, Hietala, V M, and Sorensen, N R. Tue .
"Surface property detection apparatus and method". United States.
@article{osti_101000,
title = {Surface property detection apparatus and method},
author = {Martens, J S and Ginley, D S and Hietala, V M and Sorensen, N R},
abstractNote = {Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor. 4 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {8}
}
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