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Title: Surface property detection apparatus and method

Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor. 4 figs.
Inventors:
; ; ;
Issue Date:
OSTI Identifier:
101000
Assignee:
Sandia Corp., Albuquerque, NM (United States) SNL; SCA: 420500; 360100; 360200; 360600; PA: EDB-95:131400; SN: 95001445742
Patent Number(s):
US 5,440,238/A/
Application Number:
PAN: 7-948,535
Contract Number:
AC04-76DP00789
Resource Relation:
Other Information: PBD: 8 Aug 1995
Research Org:
AT&T Corporation
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; 36 MATERIALS SCIENCE; SUPERCONDUCTORS; NONDESTRUCTIVE TESTING; ELECTRIC CONDUCTIVITY; CORROSION; ELECTRIC CONDUCTORS; DIELECTRIC MATERIALS; SEMICONDUCTOR MATERIALS; CRYSTAL GROWTH; OXIDES; CORROSION PRODUCTS; MICROWAVE EQUIPMENT; IMAGES; SURFACE PROPERTIES; DETECTION; MEASURING INSTRUMENTS; DESIGN

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