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Title: Emissivity corrected infrared method for imaging anomalous structural heat flows

A method for detecting flaws in structures using dual band infrared radiation is disclosed. Heat is applied to the structure being evaluated. The structure is scanned for two different wavelengths and data obtained in the form of images. Images are used to remove clutter to form a corrected image. The existence and nature of a flaw is determined by investigating a variety of features. 1 fig.
Inventors:
; ; ;
Issue Date:
OSTI Identifier:
100990
Assignee:
Univ. of California, Oakland, CA (United States) PTO; SCA: 420500; PA: EDB-95:131398; SN: 95001445711
Patent Number(s):
US 5,444,241/A/
Application Number:
PAN: 8-130,486
Contract Number:
W-7405-ENG-48
Resource Relation:
Other Information: PBD: 22 Aug 1995
Research Org:
University of California
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; MECHANICAL STRUCTURES; DEFECTS; INFRARED THERMOGRAPHY; NONDESTRUCTIVE TESTING; IMAGE PROCESSING