Emissivity corrected infrared method for imaging anomalous structural heat flows
Abstract
A method for detecting flaws in structures using dual band infrared radiation is disclosed. Heat is applied to the structure being evaluated. The structure is scanned for two different wavelengths and data obtained in the form of images. Images are used to remove clutter to form a corrected image. The existence and nature of a flaw is determined by investigating a variety of features. 1 fig.
- Inventors:
- Issue Date:
- Research Org.:
- Univ. of California (United States)
- OSTI Identifier:
- 100990
- Patent Number(s):
- 5444241
- Application Number:
- PAN: 8-130,486
- Assignee:
- Univ. of California, Oakland, CA (United States)
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Resource Relation:
- Other Information: PBD: 22 Aug 1995
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; MECHANICAL STRUCTURES; DEFECTS; INFRARED THERMOGRAPHY; NONDESTRUCTIVE TESTING; IMAGE PROCESSING
Citation Formats
Del Grande, N K, Durbin, P F, Dolan, K W, and Perkins, D E. Emissivity corrected infrared method for imaging anomalous structural heat flows. United States: N. p., 1995.
Web.
Del Grande, N K, Durbin, P F, Dolan, K W, & Perkins, D E. Emissivity corrected infrared method for imaging anomalous structural heat flows. United States.
Del Grande, N K, Durbin, P F, Dolan, K W, and Perkins, D E. Tue .
"Emissivity corrected infrared method for imaging anomalous structural heat flows". United States.
@article{osti_100990,
title = {Emissivity corrected infrared method for imaging anomalous structural heat flows},
author = {Del Grande, N K and Durbin, P F and Dolan, K W and Perkins, D E},
abstractNote = {A method for detecting flaws in structures using dual band infrared radiation is disclosed. Heat is applied to the structure being evaluated. The structure is scanned for two different wavelengths and data obtained in the form of images. Images are used to remove clutter to form a corrected image. The existence and nature of a flaw is determined by investigating a variety of features. 1 fig.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {8}
}
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