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Title: Impedance-estimation methods, modeling methods, articles of manufacture, impedance-modeling devices, and estimated-impedance monitoring systems

Abstract

An impedance estimation method includes measuring three or more impedances of an object having a periphery using three or more probes coupled to the periphery. The three or more impedance measurements are made at a first frequency. Three or more additional impedance measurements of the object are made using the three or more probes. The three or more additional impedance measurements are made at a second frequency different from the first frequency. An impedance of the object at a point within the periphery is estimated based on the impedance measurements and the additional impedance measurements.

Inventors:
 [1]
  1. Idaho Falls, ID
Issue Date:
Research Org.:
Idaho National Laboratory (INL), Idaho Falls, ID (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1003020
Patent Number(s):
7620507
Application Number:
11/753,214
Assignee:
Battelle Energy Alliance, LLC (Idaho Falls, ID)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
DOE Contract Number:  
AC07-05ID14517
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Richardson, John G. Impedance-estimation methods, modeling methods, articles of manufacture, impedance-modeling devices, and estimated-impedance monitoring systems. United States: N. p., 2009. Web.
Richardson, John G. Impedance-estimation methods, modeling methods, articles of manufacture, impedance-modeling devices, and estimated-impedance monitoring systems. United States.
Richardson, John G. Tue . "Impedance-estimation methods, modeling methods, articles of manufacture, impedance-modeling devices, and estimated-impedance monitoring systems". United States. https://www.osti.gov/servlets/purl/1003020.
@article{osti_1003020,
title = {Impedance-estimation methods, modeling methods, articles of manufacture, impedance-modeling devices, and estimated-impedance monitoring systems},
author = {Richardson, John G},
abstractNote = {An impedance estimation method includes measuring three or more impedances of an object having a periphery using three or more probes coupled to the periphery. The three or more impedance measurements are made at a first frequency. Three or more additional impedance measurements of the object are made using the three or more probes. The three or more additional impedance measurements are made at a second frequency different from the first frequency. An impedance of the object at a point within the periphery is estimated based on the impedance measurements and the additional impedance measurements.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2009},
month = {11}
}

Patent: