Sequential circuit design for radiation hardened multiple voltage integrated circuits
Abstract
The present invention includes a radiation hardened sequential circuit, such as a bistable circuit, flip-flop or other suitable design that presents substantial immunity to ionizing radiation while simultaneously maintaining a low operating voltage. In one embodiment, the circuit includes a plurality of logic elements that operate on relatively low voltage, and a master and slave latches each having storage elements that operate on a relatively high voltage.
- Inventors:
-
- Phoenix, AZ
- (Albuquerque, NM)
- Issue Date:
- Research Org.:
- STC.UNM (Albuquerque, NM)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1003007
- Patent Number(s):
- 7622976
- Application Number:
- 11/774,380
- Assignee:
- STC.UNM (Albuquerque, NM)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H03 - BASIC ELECTRONIC CIRCUITRY H03K - PULSE TECHNIQUE
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Clark, Lawrence T, and McIver, III, John K. Sequential circuit design for radiation hardened multiple voltage integrated circuits. United States: N. p., 2009.
Web.
Clark, Lawrence T, & McIver, III, John K. Sequential circuit design for radiation hardened multiple voltage integrated circuits. United States.
Clark, Lawrence T, and McIver, III, John K. Tue .
"Sequential circuit design for radiation hardened multiple voltage integrated circuits". United States. https://www.osti.gov/servlets/purl/1003007.
@article{osti_1003007,
title = {Sequential circuit design for radiation hardened multiple voltage integrated circuits},
author = {Clark, Lawrence T and McIver, III, John K.},
abstractNote = {The present invention includes a radiation hardened sequential circuit, such as a bistable circuit, flip-flop or other suitable design that presents substantial immunity to ionizing radiation while simultaneously maintaining a low operating voltage. In one embodiment, the circuit includes a plurality of logic elements that operate on relatively low voltage, and a master and slave latches each having storage elements that operate on a relatively high voltage.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2009},
month = {11}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Reducing radiation-hardened DigitalCircuit power consumption
journal, December 2005
- McIver, J. K.; Clark, L. T.
- IEEE Transactions on Nuclear Science, Vol. 52, Issue 6