U.S. Department of EnergyOffice of Scientific and Technical Information
Improving signal strength in serial crystallography with DIALS geometry refinement
- Authors:
- Publication Date:
- Other Number(s):
- CXIDB ID 81
- DOE Contract Number:
- AC02-05CH11231
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Coherent X-ray Imaging Data Bank; LBNL, SLAC
- Sponsoring Org.:
- LBNL, SLAC
- Keywords:
- XFEL; X-ray Free-electorn Lasers; Serial Femtosecond Crystallography; CXI; LCLS; Thermolysin
- OSTI Identifier:
- 1458714
- DOI:
- https://doi.org/10.11577/1458714
Citation Formats
AS, Brewster. Improving signal strength in serial crystallography with DIALS geometry refinement. United States: N. p., 2018.
Web. doi:10.11577/1458714.
AS, Brewster. Improving signal strength in serial crystallography with DIALS geometry refinement. United States. doi:https://doi.org/10.11577/1458714
AS, Brewster. 2018.
"Improving signal strength in serial crystallography with DIALS geometry refinement". United States. doi:https://doi.org/10.11577/1458714. https://www.osti.gov/servlets/purl/1458714. Pub date:Tue Jul 03 00:00:00 EDT 2018
@article{osti_1458714,
title = {Improving signal strength in serial crystallography with DIALS geometry refinement},
author = {AS, Brewster},
abstractNote = {},
doi = {10.11577/1458714},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 03 00:00:00 EDT 2018},
month = {Tue Jul 03 00:00:00 EDT 2018}
}
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Works referencing / citing this record:
?
dataset, January 2018
- Grünbein, Marie
- Coherent X-ray Imaging Data Bank (Lawrence Berkeley National Laboratory); Max Planck Institute for Medical Research, European XFEL