Free-Electron Laser based Multiple Particle Fluctuation Scattering Data

Pande, Kanupriya

doi:10.11577/1437269

Title: Free-Electron Laser based Multiple Particle Fluctuation Scattering Data

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Authors:

Pande, Kanupriya

CXIDB

Publication Date:: 2018-05-16

Other Number(s):: CXIDB ID 79

DOE Contract Number:: AC02-05CH11231

Research Org.:: Coherent X-ray Imaging Data Bank (Lawrence Berkeley National Laboratory); LBNL, SLAC

Sponsoring Org.:: LBNL, SLAC

Subject:: AMO; Fluctuation X-ray Scattering; LCLS; Paramecium Bursaria Chlorella virus (PBCV); X-ray Free-electorn Lasers; XFEL

OSTI Identifier:: 1437269

DOI:: https://doi.org/10.11577/1437269

Citation Formats


                    Pande, Kanupriya. Free-Electron Laser based Multiple Particle Fluctuation Scattering Data.  United States: N. p., 2018. 
        Web.  doi:10.11577/1437269.

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                    Pande, Kanupriya. Free-Electron Laser based Multiple Particle Fluctuation Scattering Data.  United States.  doi:https://doi.org/10.11577/1437269

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                    Pande, Kanupriya. 2018.  
"Free-Electron Laser based Multiple Particle Fluctuation Scattering Data".  United States.  doi:https://doi.org/10.11577/1437269.  https://www.osti.gov/servlets/purl/1437269. Pub date:Wed May 16 00:00:00 EDT 2018

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@article{osti_1437269,

  title        = {Free-Electron Laser based Multiple Particle Fluctuation Scattering Data},

  author       = {Pande, Kanupriya},

  abstractNote = {},

  doi          = {10.11577/1437269},

  journal      = {},

  number       = ,

  volume       = ,

  place        = {United States},

  year         = {2018},

  month        = {5}

}

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DOI: https://doi.org/10.11577/1437269

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Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100 000 multi-particle diffraction patterns originating frommore »« less
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Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100 000 multi-particle diffraction patterns originating frommore »« less
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Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100 000 multi-particle diffraction patterns originating frommore »« less

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