Three-dimensional ferroelectric domain imaging of epitaxial BiFeO{sub } thin films using angle-resolved piezoresponse force microscopy.

Journal Article · Fri Jan 01 00:00:00 EST 2010 · Appl. Phys. Lett.

DOI:https://doi.org/10.1063/1.3487933· OSTI ID:992403

Park, M; Hong, S; Klug, J A; Bedzyk, M J; Auciello, O; No, K; Petford-Long, A

Here we introduce angle-resolved piezoresponse force microscopy (AR-PFM), whereby the sample is rotated by 30{sup o} increments around the surface normal vector and the in-plane PFM phase signals are collected at each angle. We obtained the AR-PFM images of BaTiO{sub 3} single crystal and cube-on-cube epitaxial (001) BiFeO{sub 3} (BFO) thin film on SrRuO{sub 3}/SrTiO{sub 3} substrate, and confirmed that the AR-PFM provides more unambiguous information on the in-plane polarization directions than the conventional PFM method. Moreover, we found eight additional in-plane polarization variants in epitaxial BFO thin films, which are formed to mitigate highly unstable charged domain boundaries.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC02-06CH11357
• OSTI ID: 992403
• Report Number(s): ANL/MSD/JA-67858; TRN: US201022%%301
• Journal Information: Appl. Phys. Lett., Vol. 97, Issue 2010
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
MICROSCOPY
MONOCRYSTALS
POLARIZATION
THIN FILMS
VECTORS