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Title: Diffusion induced grain boundary migration at low temperatures and its effect on measuring chemical grain boundary diffusivities

Abstract

In the present work the authors investigate both diffusion induced grain boundary migration and grain boundary chemical diffusion in the Au/Ag system at an unusually low temperature, i.e., at room temperature. At this temperature the diffusion distance in the lattice during all experiments is very much smaller than an atomic jump distance, i.e., smaller by a factor of at least 10{sup 4}. Lattice diffusion is therefore completely frozen out. Nevertheless, the authors find that measurable DIGM occurs. The current models (at least in their present form) cannot explain these results, and some discussion is devoted to this result.

Authors:
; ;  [1]
  1. Massachusetts Inst. of Technology, Cambridge, MA (United States). Dept. of Materials Science and Engineering
Publication Date:
OSTI Identifier:
99222
DOE Contract Number:  
FG02-87ER45310
Resource Type:
Journal Article
Journal Name:
Scripta Metallurgica et Materialia
Additional Journal Information:
Journal Volume: 33; Journal Issue: 1; Other Information: PBD: 1 Jul 1995
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; GOLD ALLOYS; GRAIN BOUNDARIES; SILVER ALLOYS; DIFFUSION; TEMPERATURE DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPY; SOLUTES; CRYSTAL LATTICES; MATHEMATICAL MODELS; KIRKENDALL EFFECT; EXPERIMENTAL DATA

Citation Formats

Sommer, J, Chiang, Y M, and Balluffi, R W. Diffusion induced grain boundary migration at low temperatures and its effect on measuring chemical grain boundary diffusivities. United States: N. p., 1995. Web. doi:10.1016/0956-716X(95)00042-T.
Sommer, J, Chiang, Y M, & Balluffi, R W. Diffusion induced grain boundary migration at low temperatures and its effect on measuring chemical grain boundary diffusivities. United States. doi:10.1016/0956-716X(95)00042-T.
Sommer, J, Chiang, Y M, and Balluffi, R W. Sat . "Diffusion induced grain boundary migration at low temperatures and its effect on measuring chemical grain boundary diffusivities". United States. doi:10.1016/0956-716X(95)00042-T.
@article{osti_99222,
title = {Diffusion induced grain boundary migration at low temperatures and its effect on measuring chemical grain boundary diffusivities},
author = {Sommer, J and Chiang, Y M and Balluffi, R W},
abstractNote = {In the present work the authors investigate both diffusion induced grain boundary migration and grain boundary chemical diffusion in the Au/Ag system at an unusually low temperature, i.e., at room temperature. At this temperature the diffusion distance in the lattice during all experiments is very much smaller than an atomic jump distance, i.e., smaller by a factor of at least 10{sup 4}. Lattice diffusion is therefore completely frozen out. Nevertheless, the authors find that measurable DIGM occurs. The current models (at least in their present form) cannot explain these results, and some discussion is devoted to this result.},
doi = {10.1016/0956-716X(95)00042-T},
journal = {Scripta Metallurgica et Materialia},
number = 1,
volume = 33,
place = {United States},
year = {1995},
month = {7}
}