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Title: Effect of Gallium Focused Ion Beam Milling on Preparation of Aluminum Thin Foils

Abstract

Focus Ion Beam (FIB) milling has greatly extended the utility of atom probe and TEM because it enables sample preparation with a level of dimensional control never before possible. Using FIB it is possible to extract the samples from desired and very specific locations. The artifacts associated with this sample preparation method must also be fully understood. In this work issues specifically relevant to the FIB milling of aluminum alloys are presented. After using the FIB as a sample preparation technique it is evident that gallium will concentrate in three areas of the sample: on the surface, on grain boundaries and at interphase boundaries. This work also shows that low energy Ar ion nanomilling is potentially quite effective for removing gallium implantation layers and gallium from the internal surfaces of aluminum thin foils.

Authors:
 [1];  [2];  [2]
  1. ORNL
  2. Ohio State University
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Shared Research Equipment Collaborative Research Center
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
OSTI Identifier:
986391
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Microscopy; Journal Volume: 8; Journal Issue: 3
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ALUMINIUM ALLOYS; FOILS; GALLIUM IONS; ION BEAMS; MILLING; GRAIN BOUNDARIES; SAMPLE PREPARATION; ARGON IONS; FIB; aluminum alloys; TEM sample preparation; Ga effect

Citation Formats

Unocic, Kinga A, Mills, Michael J., and Daehn, Glenn. Effect of Gallium Focused Ion Beam Milling on Preparation of Aluminum Thin Foils. United States: N. p., 2010. Web.
Unocic, Kinga A, Mills, Michael J., & Daehn, Glenn. Effect of Gallium Focused Ion Beam Milling on Preparation of Aluminum Thin Foils. United States.
Unocic, Kinga A, Mills, Michael J., and Daehn, Glenn. Fri . "Effect of Gallium Focused Ion Beam Milling on Preparation of Aluminum Thin Foils". United States.
@article{osti_986391,
title = {Effect of Gallium Focused Ion Beam Milling on Preparation of Aluminum Thin Foils},
author = {Unocic, Kinga A and Mills, Michael J. and Daehn, Glenn},
abstractNote = {Focus Ion Beam (FIB) milling has greatly extended the utility of atom probe and TEM because it enables sample preparation with a level of dimensional control never before possible. Using FIB it is possible to extract the samples from desired and very specific locations. The artifacts associated with this sample preparation method must also be fully understood. In this work issues specifically relevant to the FIB milling of aluminum alloys are presented. After using the FIB as a sample preparation technique it is evident that gallium will concentrate in three areas of the sample: on the surface, on grain boundaries and at interphase boundaries. This work also shows that low energy Ar ion nanomilling is potentially quite effective for removing gallium implantation layers and gallium from the internal surfaces of aluminum thin foils.},
doi = {},
journal = {Journal of Microscopy},
number = 3,
volume = 8,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 2010},
month = {Fri Jan 01 00:00:00 EST 2010}
}