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Title: A bi-prism interferometer for hard x-ray photons

Abstract

Micro-fabricated bi-prisms have been used to create an interference pattern from an incident hard X-ray beam, and the intensity of the pattern probed with fluorescence from a 30 nm-thick metal film. Maximum fringe visibility exceeded 0.9 owing to the nano-sized probe and the choice of single-crystal prism material. A full near-field analysis is necessary to describe the fringe field intensities, and the transverse coherence lengths were extracted at APS beamline 8-ID-I. It is also shown that the maximum number of fringes is dependent only on the complex refractive index of the prism material.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
BROOKHAVEN NATIONAL LABORATORY (BNL)
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
985826
Report Number(s):
BNL-93875-2010-JA
Journal ID: ISSN 0909-0495; JSYRES; R&D Project: LS001; KC0401030; TRN: US201016%%2274
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Synchrotron Radiation; Journal Volume: 17; Journal Issue: 4
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; COHERENCE LENGTH; FLUORESCENCE; INTERFEROMETERS; PHOTONS; PRISMS; REFRACTIVE INDEX; VISIBILITY

Citation Formats

Isakovic, A.F., Siddons, D., Stein, A., Warren, J.B., Sandy, A.R., Narayanan, M.S., Ablett, J.M., and Metzler, M. and Evans-Lutterodt, K.. A bi-prism interferometer for hard x-ray photons. United States: N. p., 2010. Web. doi:10.1107/S0909049510012823.
Isakovic, A.F., Siddons, D., Stein, A., Warren, J.B., Sandy, A.R., Narayanan, M.S., Ablett, J.M., & Metzler, M. and Evans-Lutterodt, K.. A bi-prism interferometer for hard x-ray photons. United States. doi:10.1107/S0909049510012823.
Isakovic, A.F., Siddons, D., Stein, A., Warren, J.B., Sandy, A.R., Narayanan, M.S., Ablett, J.M., and Metzler, M. and Evans-Lutterodt, K.. Tue . "A bi-prism interferometer for hard x-ray photons". United States. doi:10.1107/S0909049510012823.
@article{osti_985826,
title = {A bi-prism interferometer for hard x-ray photons},
author = {Isakovic, A.F. and Siddons, D. and Stein, A. and Warren, J.B. and Sandy, A.R. and Narayanan, M.S. and Ablett, J.M. and Metzler, M. and Evans-Lutterodt, K.},
abstractNote = {Micro-fabricated bi-prisms have been used to create an interference pattern from an incident hard X-ray beam, and the intensity of the pattern probed with fluorescence from a 30 nm-thick metal film. Maximum fringe visibility exceeded 0.9 owing to the nano-sized probe and the choice of single-crystal prism material. A full near-field analysis is necessary to describe the fringe field intensities, and the transverse coherence lengths were extracted at APS beamline 8-ID-I. It is also shown that the maximum number of fringes is dependent only on the complex refractive index of the prism material.},
doi = {10.1107/S0909049510012823},
journal = {Journal of Synchrotron Radiation},
number = 4,
volume = 17,
place = {United States},
year = {Tue Apr 06 00:00:00 EDT 2010},
month = {Tue Apr 06 00:00:00 EDT 2010}
}