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Title: NMR characterization of thin films

Abstract

A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.

Inventors:
 [1];  [2];  [3];  [4];  [5]
  1. (Brookfield, IL)
  2. (Glenview, IL)
  3. (Homer Glen, IL)
  4. (Chicago, IL)
  5. (Westchester, IL)
Publication Date:
Research Org.:
ANL (Argonne National Laboratory (ANL), Argonne, IL (United States))
Sponsoring Org.:
USDOE
OSTI Identifier:
985652
Patent Number(s):
7,456,630
Application Number:
11/484,348; TRN: US201016%%2095
Assignee:
NMR characterization of thin films ANL
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CONTAINERS; THIN FILMS; MATERIALS

Citation Formats

Gerald, II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, and Vukovic, Lela. NMR characterization of thin films. United States: N. p., 2008. Web.
Gerald, II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, & Vukovic, Lela. NMR characterization of thin films. United States.
Gerald, II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, and Vukovic, Lela. Tue . "NMR characterization of thin films". United States. https://www.osti.gov/servlets/purl/985652.
@article{osti_985652,
title = {NMR characterization of thin films},
author = {Gerald, II, Rex E. and Klingler, Robert J. and Rathke, Jerome W. and Diaz, Rocio and Vukovic, Lela},
abstractNote = {A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2008},
month = {11}
}

Patent:

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