Spin microscope based on optically detected magnetic resonance
Abstract
The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.
- Inventors:
-
- Los Alamos, NM
- Publication Date:
- Research Org.:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 985215
- Patent Number(s):
- 7,743,648
- Application Number:
- 11/845,982
- Assignee:
- The United States of America as represented by the United States Department of Energy (Washington, DC)
- DOE Contract Number:
- W-7405-ENG-36
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Berman, Gennady P, and Chernobrod, Boris M. Spin microscope based on optically detected magnetic resonance. United States: N. p., 2010.
Web.
Berman, Gennady P, & Chernobrod, Boris M. Spin microscope based on optically detected magnetic resonance. United States.
Berman, Gennady P, and Chernobrod, Boris M. 2010.
"Spin microscope based on optically detected magnetic resonance". United States. https://www.osti.gov/servlets/purl/985215.
@article{osti_985215,
title = {Spin microscope based on optically detected magnetic resonance},
author = {Berman, Gennady P and Chernobrod, Boris M},
abstractNote = {The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.},
doi = {},
url = {https://www.osti.gov/biblio/985215},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 29 00:00:00 EDT 2010},
month = {Tue Jun 29 00:00:00 EDT 2010}
}
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