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Title: A high-resolution fluorescence analyzer with large solid-angle coverage and wide tunability.

Abstract

We have developed and tested a crystal-optic X-ray fluorescence analyzer, which combines the features of electron-volt energy resolution, large solid angle coverage, and a demonstrated tunability over a photon-energy range from ca. 6.5 to 12 keV. It is based upon the principle of active optics to precisely adjust the shape of a strip of silicon. Although the primary use of the device is in high resolution X-ray spectroscopy, it can also be used for imaging. We present the basic design and two illustrative applications in atomic physics and trace-element analysis.

Authors:
; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
982322
Report Number(s):
ANL/XFD/CP-118662
Journal ID: ISSN 0168-9002; TRN: US201013%%1000
DOE Contract Number:
DE-AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Journal Name: Nucl. Instrum. Methods Phys. Res. A; Journal Volume: 582; Journal Issue: 1 ; 2007; Conference: 9th Inernational on Synchrotron Radiation Instrumentation (SRI 2006); May 28, 2006 - Jun. 2, 2006; Daegu, Korea
Country of Publication:
United States
Language:
ENGLISH
Subject:
47 OTHER INSTRUMENTATION; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ATOMIC PHYSICS; BASIC; DESIGN; ENERGY RESOLUTION; EQUIPMENT; FLUORESCENCE; OPTICS; RANGE; RESOLUTION; SHAPE; SILICON; SOLIDS; SYNCHROTRON RADIATION; USES; X-RAY FLUORESCENCE ANALYZERS; X-RAY SPECTROSCOPY

Citation Formats

Adams, B. W., Attenkofer, K., and X-Ray Science Division. A high-resolution fluorescence analyzer with large solid-angle coverage and wide tunability.. United States: N. p., 2007. Web. doi:10.1016/j.nima.2007.08.142.
Adams, B. W., Attenkofer, K., & X-Ray Science Division. A high-resolution fluorescence analyzer with large solid-angle coverage and wide tunability.. United States. doi:10.1016/j.nima.2007.08.142.
Adams, B. W., Attenkofer, K., and X-Ray Science Division. Mon . "A high-resolution fluorescence analyzer with large solid-angle coverage and wide tunability.". United States. doi:10.1016/j.nima.2007.08.142.
@article{osti_982322,
title = {A high-resolution fluorescence analyzer with large solid-angle coverage and wide tunability.},
author = {Adams, B. W. and Attenkofer, K. and X-Ray Science Division},
abstractNote = {We have developed and tested a crystal-optic X-ray fluorescence analyzer, which combines the features of electron-volt energy resolution, large solid angle coverage, and a demonstrated tunability over a photon-energy range from ca. 6.5 to 12 keV. It is based upon the principle of active optics to precisely adjust the shape of a strip of silicon. Although the primary use of the device is in high resolution X-ray spectroscopy, it can also be used for imaging. We present the basic design and two illustrative applications in atomic physics and trace-element analysis.},
doi = {10.1016/j.nima.2007.08.142},
journal = {Nucl. Instrum. Methods Phys. Res. A},
number = 1 ; 2007,
volume = 582,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}

Conference:
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