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Title: Stress mitigation of x-ray beamline monochromators using topography test unit.

Abstract

Silicon and diamond monochromators (crystals), often used in the Advanced Photon Source X-ray beamlines, require a good quality surface finish and stress-free installation to ensure optimal performance. The device used to mount the crystal has been shown to be ajor contributing source of stress. In this case, an adjustable mounting device is an effective method of reducing stresses and improve the rocking curve to levels much closer to ideal. Analysis by a topography test unit has been used to determine the distribution of stresses and to measure the rocking curve, as well as create CCD images of the crystal. This paper describes the process of measuring these stresses and manipulating the mounting device and crystal to create a substantially improved monochromator.

Authors:
; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
OSTI Identifier:
982024
Report Number(s):
ANL/XSD/JA-57247
Journal ID: 1097-0002; TRN: US1004258
DOE Contract Number:
DE-AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Journal Name: Adv. X-ray Anal.; Journal Volume: 50; Journal Issue: 2007; Conference: 2006 Denver X-Ray Conference; Aug. 7, 2006 - Aug. 11, 2006; Denver, CO
Country of Publication:
United States
Language:
ENGLISH
Subject:
43 PARTICLE ACCELERATORS; ADVANCED PHOTON SOURCE; CHARGE-COUPLED DEVICES; CRYSTALS; DIAMONDS; DISTRIBUTION; EQUIPMENT; IMAGES; INSTALLATION; LEVELS; MEETINGS; MITIGATION; MONOCHROMATORS; NEUTRON DIFFRACTION; PERFORMANCE; SILICON; STRESSES; SURFACES; TOPOGRAPHY; UNITS; WELLS

Citation Formats

Maj, J., Waldschmidt, G., Baldo, P., Macrander, A., Koshelev, I., Huang, R., Maj, L., Maj, A., Univ. of Chicago, Northeastern Ohio Univ. Coll. of Medicine, and Rosalind Franklin Univ. of Medicine and Science. Stress mitigation of x-ray beamline monochromators using topography test unit.. United States: N. p., 2007. Web.
Maj, J., Waldschmidt, G., Baldo, P., Macrander, A., Koshelev, I., Huang, R., Maj, L., Maj, A., Univ. of Chicago, Northeastern Ohio Univ. Coll. of Medicine, & Rosalind Franklin Univ. of Medicine and Science. Stress mitigation of x-ray beamline monochromators using topography test unit.. United States.
Maj, J., Waldschmidt, G., Baldo, P., Macrander, A., Koshelev, I., Huang, R., Maj, L., Maj, A., Univ. of Chicago, Northeastern Ohio Univ. Coll. of Medicine, and Rosalind Franklin Univ. of Medicine and Science. Mon . "Stress mitigation of x-ray beamline monochromators using topography test unit.". United States. doi:.
@article{osti_982024,
title = {Stress mitigation of x-ray beamline monochromators using topography test unit.},
author = {Maj, J. and Waldschmidt, G. and Baldo, P. and Macrander, A. and Koshelev, I. and Huang, R. and Maj, L. and Maj, A. and Univ. of Chicago and Northeastern Ohio Univ. Coll. of Medicine and Rosalind Franklin Univ. of Medicine and Science},
abstractNote = {Silicon and diamond monochromators (crystals), often used in the Advanced Photon Source X-ray beamlines, require a good quality surface finish and stress-free installation to ensure optimal performance. The device used to mount the crystal has been shown to be ajor contributing source of stress. In this case, an adjustable mounting device is an effective method of reducing stresses and improve the rocking curve to levels much closer to ideal. Analysis by a topography test unit has been used to determine the distribution of stresses and to measure the rocking curve, as well as create CCD images of the crystal. This paper describes the process of measuring these stresses and manipulating the mounting device and crystal to create a substantially improved monochromator.},
doi = {},
journal = {Adv. X-ray Anal.},
number = 2007,
volume = 50,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}

Conference:
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