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Title: Metal-oxide Nanowires for Toxic Gas Detection

Abstract

The feasibility of using Electric field enhanced oxidation (EFEO) to fabricate metal-oxide nanowires for sensing toxic gases was investigated. The effects of fabrication parameters such as film thickness, ambient relative humidity, atomic force microscope (AFM) tip bias voltage, force, scan speed and number of scans on the growth of nanowires were determined. The chemical composition of indium-oxide nanowires was verified using Auger electron spectroscopy. It was found that oxygen to indium ration was 1.69, 1.72, 1.71 and 1.84 at depths of 0, 1.3, 2.5, and 3.8 nm, which was near the 1.5:1 expected for stoichiometric indium-oxide film. Future work will include characterizing the electrical and gas sensing properties of the metal-oxide nanowires.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Org.:
USDOE
OSTI Identifier:
982010
Report Number(s):
PNNL-SA-52754
9796; KP1704020; TRN: US201012%%1445
DOE Contract Number:
AC05-76RL01830
Resource Type:
Conference
Resource Relation:
Conference: Nanotech 2005, 2:519-522
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CHEMICAL COMPOSITION; DETECTION; ELECTRIC FIELDS; ELECTRIC POTENTIAL; FABRICATION; FILMS; GASES; GROWTH; HUMIDITY; INDIUM; MICROSCOPES; OXIDATION; OXYGEN; THICKNESS; VELOCITY; WORK; Electric field enhanced oxidation; nanosensors; Environmental Molecular Sciences Laboratory

Citation Formats

Devineni, D. P., Stormo, S., Kempf, W., Schenkel, J., Behanan, R., Lea, Alan S., and Galipeau, David W. Metal-oxide Nanowires for Toxic Gas Detection. United States: N. p., 2007. Web.
Devineni, D. P., Stormo, S., Kempf, W., Schenkel, J., Behanan, R., Lea, Alan S., & Galipeau, David W. Metal-oxide Nanowires for Toxic Gas Detection. United States.
Devineni, D. P., Stormo, S., Kempf, W., Schenkel, J., Behanan, R., Lea, Alan S., and Galipeau, David W. Tue . "Metal-oxide Nanowires for Toxic Gas Detection". United States. doi:.
@article{osti_982010,
title = {Metal-oxide Nanowires for Toxic Gas Detection},
author = {Devineni, D. P. and Stormo, S. and Kempf, W. and Schenkel, J. and Behanan, R. and Lea, Alan S. and Galipeau, David W.},
abstractNote = {The feasibility of using Electric field enhanced oxidation (EFEO) to fabricate metal-oxide nanowires for sensing toxic gases was investigated. The effects of fabrication parameters such as film thickness, ambient relative humidity, atomic force microscope (AFM) tip bias voltage, force, scan speed and number of scans on the growth of nanowires were determined. The chemical composition of indium-oxide nanowires was verified using Auger electron spectroscopy. It was found that oxygen to indium ration was 1.69, 1.72, 1.71 and 1.84 at depths of 0, 1.3, 2.5, and 3.8 nm, which was near the 1.5:1 expected for stoichiometric indium-oxide film. Future work will include characterizing the electrical and gas sensing properties of the metal-oxide nanowires.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 02 00:00:00 EST 2007},
month = {Tue Jan 02 00:00:00 EST 2007}
}

Conference:
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