skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Chemical Solution Based Epitaxial Oxide Filmes on Biaxially Textured Ni-W Substrates with Improved Out-of-Plane Texture for YBCO Coated Conductors

Abstract

Epitaxial films of rare-earth (RE) niobates (where the rare earth includes La, Ce, and Nd) and lanthanum tantalate with pyrochlore structures were grown directly on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using a chemical solution deposition (CSD) process. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) analysis revealed the surface morphology of the films to be smooth and homogeneous. Detailed X-ray diffraction analysis showed that the films of pyrochlore RE niobate and La-tantalate are highly textured with cube-on-cube epitaxy. The overall texture quality of the films was investigated by measuring the full-width half-maximum (FWHM) of the (004) and (222) rocking curves. We observed a sharper texture for both lanthanum niobate (La{sub 3}NbO{sub 7}) and lanthanum tantalate (La{sub 3}TaO{sub 7}) films compared to the underlying Ni-W substrate, though they have a larger lattice misfit with the Ni-W substrates. These results were comparable to the texture improvement observed in vacuum-deposited Y{sub 2}O{sub 3} seed layers. Texture improvement in the seed layer is the key towards obtaining YBCO films with a higher critical current density. Hence, solution-deposited La{sub 3}NbO{sub 7} and La{sub 3}TaO{sub 7} films can be used as a seed layer towards developing all metalorganic-deposited (MOD) buffer/YBCO architectures.

Authors:
 [1];  [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
OE USDOE - Office of Electric Transmission and Distribution
OSTI Identifier:
978741
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Electronic Materials; Journal Volume: 36; Journal Issue: 10
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; CRITICAL CURRENT; DEPOSITION; EPITAXY; LANTHANUM; MORPHOLOGY; NEUTRON DIFFRACTION; NIOBATES; OXIDES; PYROCHLORE; RARE EARTHS; SCANNING ELECTRON MICROSCOPY; SEEDS; SUBSTRATES; TANTALATES; TEXTURE; TUNGSTEN; X-RAY DIFFRACTION

Citation Formats

Bhuiyan, Md S, Paranthaman, Mariappan Parans, and Sathyamurthy, Srivatsan. Chemical Solution Based Epitaxial Oxide Filmes on Biaxially Textured Ni-W Substrates with Improved Out-of-Plane Texture for YBCO Coated Conductors. United States: N. p., 2007. Web. doi:10.1007/s11664-007-0228-z.
Bhuiyan, Md S, Paranthaman, Mariappan Parans, & Sathyamurthy, Srivatsan. Chemical Solution Based Epitaxial Oxide Filmes on Biaxially Textured Ni-W Substrates with Improved Out-of-Plane Texture for YBCO Coated Conductors. United States. doi:10.1007/s11664-007-0228-z.
Bhuiyan, Md S, Paranthaman, Mariappan Parans, and Sathyamurthy, Srivatsan. Mon . "Chemical Solution Based Epitaxial Oxide Filmes on Biaxially Textured Ni-W Substrates with Improved Out-of-Plane Texture for YBCO Coated Conductors". United States. doi:10.1007/s11664-007-0228-z.
@article{osti_978741,
title = {Chemical Solution Based Epitaxial Oxide Filmes on Biaxially Textured Ni-W Substrates with Improved Out-of-Plane Texture for YBCO Coated Conductors},
author = {Bhuiyan, Md S and Paranthaman, Mariappan Parans and Sathyamurthy, Srivatsan},
abstractNote = {Epitaxial films of rare-earth (RE) niobates (where the rare earth includes La, Ce, and Nd) and lanthanum tantalate with pyrochlore structures were grown directly on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using a chemical solution deposition (CSD) process. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) analysis revealed the surface morphology of the films to be smooth and homogeneous. Detailed X-ray diffraction analysis showed that the films of pyrochlore RE niobate and La-tantalate are highly textured with cube-on-cube epitaxy. The overall texture quality of the films was investigated by measuring the full-width half-maximum (FWHM) of the (004) and (222) rocking curves. We observed a sharper texture for both lanthanum niobate (La{sub 3}NbO{sub 7}) and lanthanum tantalate (La{sub 3}TaO{sub 7}) films compared to the underlying Ni-W substrate, though they have a larger lattice misfit with the Ni-W substrates. These results were comparable to the texture improvement observed in vacuum-deposited Y{sub 2}O{sub 3} seed layers. Texture improvement in the seed layer is the key towards obtaining YBCO films with a higher critical current density. Hence, solution-deposited La{sub 3}NbO{sub 7} and La{sub 3}TaO{sub 7} films can be used as a seed layer towards developing all metalorganic-deposited (MOD) buffer/YBCO architectures.},
doi = {10.1007/s11664-007-0228-z},
journal = {Journal of Electronic Materials},
number = 10,
volume = 36,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}