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Title: Dynamic Behavior in Piezoresponse Force Microstopy

Abstract

Frequency-dependent dynamic behavior in piezoresponse force microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analysed using a combination of modelling and experimental measurements. The PFM signal is comprised of contributions from local electrostatic forces acting on the tip, distributed forces acting on the cantilever, and three components of the electromechanical response vector. These interactions result in the flexural and torsional oscillations of the cantilever, detected as vertical and lateral PFM signals. The relative magnitudes of these contributions depend on geometric parameters of the system, on the stiffnesses and frictional forces of the tip-surface junction, and on the frequency of operation. The dynamic signal formation mechanism in PFM is analysed and conditions for optimal PFM imaging are formulated. An experimental approach for probing cantilever dynamics using frequency-bias spectroscopy and deconvolution of electromechanical and electrostatic contrast is implemented

Authors:
 [1];  [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Laboratory Directed Research and Development (LDRD) Program
OSTI Identifier:
978161
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Nanotechnology; Journal Volume: 17; Journal Issue: 6
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; ATOMIC FORCE MICROSCOPY; PIEZOELECTRICITY; FREQUENCY DEPENDENCE; RESPONSE FUNCTIONS; ELECTROSTATICS; OSCILLATIONS; DYNAMICS; PERFORMANCE

Citation Formats

Jesse, Stephen, Baddorf, Arthur P, and Kalinin, Sergei V. Dynamic Behavior in Piezoresponse Force Microstopy. United States: N. p., 2006. Web. doi:10.1088/0957-4484/17/6/014.
Jesse, Stephen, Baddorf, Arthur P, & Kalinin, Sergei V. Dynamic Behavior in Piezoresponse Force Microstopy. United States. doi:10.1088/0957-4484/17/6/014.
Jesse, Stephen, Baddorf, Arthur P, and Kalinin, Sergei V. Sun . "Dynamic Behavior in Piezoresponse Force Microstopy". United States. doi:10.1088/0957-4484/17/6/014.
@article{osti_978161,
title = {Dynamic Behavior in Piezoresponse Force Microstopy},
author = {Jesse, Stephen and Baddorf, Arthur P and Kalinin, Sergei V},
abstractNote = {Frequency-dependent dynamic behavior in piezoresponse force microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analysed using a combination of modelling and experimental measurements. The PFM signal is comprised of contributions from local electrostatic forces acting on the tip, distributed forces acting on the cantilever, and three components of the electromechanical response vector. These interactions result in the flexural and torsional oscillations of the cantilever, detected as vertical and lateral PFM signals. The relative magnitudes of these contributions depend on geometric parameters of the system, on the stiffnesses and frictional forces of the tip-surface junction, and on the frequency of operation. The dynamic signal formation mechanism in PFM is analysed and conditions for optimal PFM imaging are formulated. An experimental approach for probing cantilever dynamics using frequency-bias spectroscopy and deconvolution of electromechanical and electrostatic contrast is implemented},
doi = {10.1088/0957-4484/17/6/014},
journal = {Nanotechnology},
number = 6,
volume = 17,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}