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Title: Improving flux pinning in YBa[sub 2]Cu[sub 3]O[sub 7] coated conductors by changing the buffer layer deposition conditions

Abstract

We present a comparative study of the flux pinning properties of YBa{sub 2}Cu{sub 3}O{sub 7} films deposited by pulsed laser deposition on polycrystalline metal substrates with a biaxially oriented MgO template produced by ion-beam-assisted deposition (IBAD), varying the deposition temperature (T{sub STO}) for the SrTiO{sub 3} buffer layer. We find that when T{sub STO} = T*{sub STO} = 820 C, the critical current density at self-field (J{sub c}{sup sf}) is maximized and the surface roughness minimized. On the contrary, in-field critical current density (J{sub c}) measurements show that at high fields, samples with T{sub STO} <T*{sub STO} present higher J{sub c}. Angular-dependent J{sub c} measurements show that this improvement is due to the presence of additional extended parallel defects (in particular, thread dislocations), which produce a peak in J{sub c} centered in the c-axis direction. We use the field dependence of the height and the width of this peak to compare the density of the correlated defects in samples prepared with different T{sub STO}.

Authors:
 [1];  [2];  [3];  [4];  [5]
  1. Boris Alfredo
  2. Haiyan
  3. Stephen R.
  4. Paul N.
  5. Leonardo
Publication Date:
Research Org.:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
977533
Report Number(s):
LA-UR-04-2227
TRN: US201009%%826
Resource Type:
Conference
Resource Relation:
Conference: Submitted to 106th American Ceramic Society Meeting, Indianpolis, IN, April 14-21, 2004
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BUFFERS; CERAMICS; CRITICAL CURRENT; DEFECTS; DEPOSITION; DISLOCATIONS; LASERS; MAGNETIC FLUX; ROUGHNESS; SUBSTRATES

Citation Formats

Maiorov, B A, Wang, H, Foltyn, S R, Arendt, P N, and Civale, L. Improving flux pinning in YBa[sub 2]Cu[sub 3]O[sub 7] coated conductors by changing the buffer layer deposition conditions. United States: N. p., 2004. Web.
Maiorov, B A, Wang, H, Foltyn, S R, Arendt, P N, & Civale, L. Improving flux pinning in YBa[sub 2]Cu[sub 3]O[sub 7] coated conductors by changing the buffer layer deposition conditions. United States.
Maiorov, B A, Wang, H, Foltyn, S R, Arendt, P N, and Civale, L. 2004. "Improving flux pinning in YBa[sub 2]Cu[sub 3]O[sub 7] coated conductors by changing the buffer layer deposition conditions". United States. https://www.osti.gov/servlets/purl/977533.
@article{osti_977533,
title = {Improving flux pinning in YBa[sub 2]Cu[sub 3]O[sub 7] coated conductors by changing the buffer layer deposition conditions},
author = {Maiorov, B A and Wang, H and Foltyn, S R and Arendt, P N and Civale, L},
abstractNote = {We present a comparative study of the flux pinning properties of YBa{sub 2}Cu{sub 3}O{sub 7} films deposited by pulsed laser deposition on polycrystalline metal substrates with a biaxially oriented MgO template produced by ion-beam-assisted deposition (IBAD), varying the deposition temperature (T{sub STO}) for the SrTiO{sub 3} buffer layer. We find that when T{sub STO} = T*{sub STO} = 820 C, the critical current density at self-field (J{sub c}{sup sf}) is maximized and the surface roughness minimized. On the contrary, in-field critical current density (J{sub c}) measurements show that at high fields, samples with T{sub STO} <T*{sub STO} present higher J{sub c}. Angular-dependent J{sub c} measurements show that this improvement is due to the presence of additional extended parallel defects (in particular, thread dislocations), which produce a peak in J{sub c} centered in the c-axis direction. We use the field dependence of the height and the width of this peak to compare the density of the correlated defects in samples prepared with different T{sub STO}.},
doi = {},
url = {https://www.osti.gov/biblio/977533}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2004},
month = {Thu Jan 01 00:00:00 EST 2004}
}

Conference:
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