Measurment and energy correction due to charge carrier lifetimes in large HPGe spectrometers

Kephart, Jeremy D; Aalseth, Craig E; Miley, Harry S

doi:10.1007/s10967-009-0216-2

Title: Measurment and energy correction due to charge carrier lifetimes in large HPGe spectrometers

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Abstract

This work addresses the energy spectrum correction due to increased charge carrier collection times in larger HPGe spectrometers. The energy of the radiation interaction is expected to be proportional to the total collected charge. This is increasingly not true with larger HPGe spectrometers. Some charge is lost as the total charge travels from the interaction location to the collection electrode. This path dependent loss of charge results in decreased energy resolution. In HPGe spectrometers, this process is characterized by the charge carrier lifetime constant and is given as an exponential function of the charge carrier collection time divided by this constant. Thus large detectors can experience exponential decrease in energy resolution as charge carrier collection time increases. We study the effect of charge carrier lifetime on energy resolution for a large diameter p-type coaxial and p-type point contact HPGe spectrometers using pulse shape analysis. We present a method to measure the charge carrier lifetime for a given HPGe spectrometer.

Authors:: Kephart, Jeremy D; Aalseth, Craig E; Miley, Harry S

Publication Date:: Tue Dec 01 00:00:00 EST 2009

Research Org.:: Pacific Northwest National Lab. (PNNL), Richland, WA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 972546

Report Number(s):: PNNL-SA-65747
Journal ID: ISSN 0236-5731; JRNCDM; TRN: US1001609

DOE Contract Number:: AC05-76RL01830

Resource Type:: Journal Article

Journal Name:: Journal of Radioanalytical and Nuclear Chemistry, 282(3):897-900

Additional Journal Information:: Journal Volume: 282; Journal Issue: 3; Journal ID: ISSN 0236-5731

Country of Publication:: United States

Language:: English

Subject:: 38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY; CHARGE CARRIERS; ENERGY RESOLUTION; LIFETIME; RADIATIONS; SHAPE; SPECTROMETERS; Charge carrier lifetime; Germanium; HPGe; Spectrometers

Citation Formats


                    Kephart, Jeremy D, Aalseth, Craig E, and Miley, Harry S. Measurment and energy correction due to charge carrier lifetimes in large HPGe spectrometers.  United States: N. p., 2009. 
        Web.  doi:10.1007/s10967-009-0216-2.

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                    Kephart, Jeremy D, Aalseth, Craig E, & Miley, Harry S. Measurment and energy correction due to charge carrier lifetimes in large HPGe spectrometers.  United States.  https://doi.org/10.1007/s10967-009-0216-2

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                    Kephart, Jeremy D, Aalseth, Craig E, and Miley, Harry S. 2009.  
        "Measurment and energy correction due to charge carrier lifetimes in large HPGe spectrometers".  United States.  https://doi.org/10.1007/s10967-009-0216-2.

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@article{osti_972546,

  title        = {Measurment and energy correction due to charge carrier lifetimes in large HPGe spectrometers},

  author       = {Kephart, Jeremy D and Aalseth, Craig E and Miley, Harry S},

  abstractNote = {This work addresses the energy spectrum correction due to increased charge carrier collection times in larger HPGe spectrometers. The energy of the radiation interaction is expected to be proportional to the total collected charge. This is increasingly not true with larger HPGe spectrometers. Some charge is lost as the total charge travels from the interaction location to the collection electrode. This path dependent loss of charge results in decreased energy resolution. In HPGe spectrometers, this process is characterized by the charge carrier lifetime constant and is given as an exponential function of the charge carrier collection time divided by this constant. Thus large detectors can experience exponential decrease in energy resolution as charge carrier collection time increases. We study the effect of charge carrier lifetime on energy resolution for a large diameter p-type coaxial and p-type point contact HPGe spectrometers using pulse shape analysis. We present a method to measure the charge carrier lifetime for a given HPGe spectrometer.},

  doi          = {10.1007/s10967-009-0216-2},

  url          = {https://www.osti.gov/biblio/972546},
  journal      = {Journal of Radioanalytical and Nuclear Chemistry, 282(3):897-900},

  issn         = {0236-5731},

  number       = 3,

  volume       = 282,

  place        = {United States},

  year         = {Tue Dec 01 00:00:00 EST 2009},

  month        = {Tue Dec 01 00:00:00 EST 2009}

}

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