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Title: Materials analysis using photon-in photon-out spectroscopy.

Abstract

Recent interest in nanotechnology and Organic Light Emitting Devices (OLED) has prompted intense research in the electronic structure and optical properties of relevant materials. Here we report recent development and applications of X-ray excited optical luminescence (XEOL). XEOL, using tunable synchrotron light as an excitation source, monitors the optical response following inner shell excitation of an element in a light emitting material in both the energy and time domain. XEOL from several prototype materials will be presented to illustrate its application in material analysis. In XEOL measurements, we first record the x-ray absorption near edge structures (XANES) of an element, e.g. carbon K-edge in OLED materials and Si K-edge in silicon nanostructures. Photon energies from below to above the edge are then selected to excite the system. Photoluminescence is recorded with conventional optical monochromator and photomultiplier (PMT) instrumentation. The total luminescence yield (zero order) or the partial luminescence yield (PLY), is in turn used to obtain the XANES. In time-resolved studies, the short synchrotron light pulse is used as a strobe. Here, the PMT signal ({approx}2 ns resolution) is used as the start and the synchrotron pulse (bunch clock) as the stop. The time interval between the strobes is usedmore » to monitor the intensity decay. A time window (e.g. 0-10 ns after excitation) can be selected between pulses. The light emitted within this window is used to record time-resolved XEOL (TRXEOL) and optical XANES. Timing measurements reported here were conducted at the Advanced Photon Source (APS) in a top-up mode, and the Synchrotron Radiation Center (SRC), University of Wisconsin-Madison and the Canadian Light Source (CLS) using a single bunch. The pulse width was <100 ps in all cases and the repetition rate at APS, SRC and CLS was 153 ns, 300 ns, and 570 ns, respectively. A schematic is shown in Fig.1 where the green arrow represents the SR pulse and the red arrow the emission upon the relaxation of the excited state. nanowire was prepared in our laboratory. As-prepared SiNW is encapsulated with a thin layer of oxide. Other samples were obtained commercially.« less

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE; National Science Foundation (NSF); FOR
OSTI Identifier:
971923
Report Number(s):
ANL/XFD/CP-118963
TRN: US1001414
DOE Contract Number:
DE-AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Conference: 5th International Conference on Synchrotron Radiation in Materials Science (SRMS 5); Jul. 30, 2006 - Aug. 2, 2006; Chicago, IL
Country of Publication:
United States
Language:
ENGLISH
Subject:
43 PARTICLE ACCELERATORS; ADVANCED PHOTON SOURCE; CARBON; DECAY; ELECTRONIC STRUCTURE; EXCITATION; EXCITED STATES; INNER-SHELL EXCITATION; LIGHT SOURCES; LUMINESCENCE; MONOCHROMATORS; NANOSTRUCTURES; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PHOTOMULTIPLIERS; PHOTONS; SILICON; SPECTROSCOPY; SYNCHROTRON RADIATION; SYNCHROTRONS

Citation Formats

Sham, T. K., Kim, P.-S. G., Lam, S., Zhou, X. T., Rosenberg, R. A., Shenoy, G. K., Heigl, F., Jurgensen, A., Regier, T., Coulthard, I., Zuin, L., Hu, Y. -F., Univ. of Western Ontario, Univ. of Wisconsin at Madison, and Univ. of Saskatchewan. Materials analysis using photon-in photon-out spectroscopy.. United States: N. p., 2006. Web.
Sham, T. K., Kim, P.-S. G., Lam, S., Zhou, X. T., Rosenberg, R. A., Shenoy, G. K., Heigl, F., Jurgensen, A., Regier, T., Coulthard, I., Zuin, L., Hu, Y. -F., Univ. of Western Ontario, Univ. of Wisconsin at Madison, & Univ. of Saskatchewan. Materials analysis using photon-in photon-out spectroscopy.. United States.
Sham, T. K., Kim, P.-S. G., Lam, S., Zhou, X. T., Rosenberg, R. A., Shenoy, G. K., Heigl, F., Jurgensen, A., Regier, T., Coulthard, I., Zuin, L., Hu, Y. -F., Univ. of Western Ontario, Univ. of Wisconsin at Madison, and Univ. of Saskatchewan. Sun . "Materials analysis using photon-in photon-out spectroscopy.". United States. doi:.
@article{osti_971923,
title = {Materials analysis using photon-in photon-out spectroscopy.},
author = {Sham, T. K. and Kim, P.-S. G. and Lam, S. and Zhou, X. T. and Rosenberg, R. A. and Shenoy, G. K. and Heigl, F. and Jurgensen, A. and Regier, T. and Coulthard, I. and Zuin, L. and Hu, Y. -F. and Univ. of Western Ontario and Univ. of Wisconsin at Madison and Univ. of Saskatchewan},
abstractNote = {Recent interest in nanotechnology and Organic Light Emitting Devices (OLED) has prompted intense research in the electronic structure and optical properties of relevant materials. Here we report recent development and applications of X-ray excited optical luminescence (XEOL). XEOL, using tunable synchrotron light as an excitation source, monitors the optical response following inner shell excitation of an element in a light emitting material in both the energy and time domain. XEOL from several prototype materials will be presented to illustrate its application in material analysis. In XEOL measurements, we first record the x-ray absorption near edge structures (XANES) of an element, e.g. carbon K-edge in OLED materials and Si K-edge in silicon nanostructures. Photon energies from below to above the edge are then selected to excite the system. Photoluminescence is recorded with conventional optical monochromator and photomultiplier (PMT) instrumentation. The total luminescence yield (zero order) or the partial luminescence yield (PLY), is in turn used to obtain the XANES. In time-resolved studies, the short synchrotron light pulse is used as a strobe. Here, the PMT signal ({approx}2 ns resolution) is used as the start and the synchrotron pulse (bunch clock) as the stop. The time interval between the strobes is used to monitor the intensity decay. A time window (e.g. 0-10 ns after excitation) can be selected between pulses. The light emitted within this window is used to record time-resolved XEOL (TRXEOL) and optical XANES. Timing measurements reported here were conducted at the Advanced Photon Source (APS) in a top-up mode, and the Synchrotron Radiation Center (SRC), University of Wisconsin-Madison and the Canadian Light Source (CLS) using a single bunch. The pulse width was <100 ps in all cases and the repetition rate at APS, SRC and CLS was 153 ns, 300 ns, and 570 ns, respectively. A schematic is shown in Fig.1 where the green arrow represents the SR pulse and the red arrow the emission upon the relaxation of the excited state. nanowire was prepared in our laboratory. As-prepared SiNW is encapsulated with a thin layer of oxide. Other samples were obtained commercially.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}

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  • This report discusses the following topics: Mother nature's finest test probe; soft x-ray emission spectroscopy with high-brightness synchrotron radiation sources; anisotropy and polarization of x-ray emission from atoms and molecules; valence-hole fluorescence from molecular photoions as a probe of shape-resonance ionization: progress and prospects; structural biophysics on third-generation synchrotron sources; ultra-soft x-ray fluorescence-yield XAFS: an in situ photon-in, photon-out spectroscopy; and x-ray microprobe: an analytical tool for imaging elemental composition and microstructure.
  • This report discusses the following topics: Mother nature`s finest test probe; soft x-ray emission spectroscopy with high-brightness synchrotron radiation sources; anisotropy and polarization of x-ray emission from atoms and molecules; valence-hole fluorescence from molecular photoions as a probe of shape-resonance ionization: progress and prospects; structural biophysics on third-generation synchrotron sources; ultra-soft x-ray fluorescence-yield XAFS: an in situ photon-in, photon-out spectroscopy; and x-ray microprobe: an analytical tool for imaging elemental composition and microstructure.
  • The applications of resonant soft X-ray emission spectroscopy on a variety of carbon systems have yielded characteristic fingerprints. With high-resolution monochromatized synchrotron radiation excitation, resonant inelastic X-ray scattering has emerged as a new source of information about electronic structure and excitation dynamics. Photon-in/photon-out soft-X-ray spectroscopy is used to study the electronic properties of fundamental materials, nanostructure, and complex hydrides and will offer potential in-depth understanding of chemisorption and/or physisorption mechanisms of hydrogen adsorption/desorption capacity and kinetics.
  • We are using a defect analysis capabilities based on two positron beam lifetime spectrometers: the first is based on a 3 MeV electrostatic accelerator and the second on our high current linac beam. The high energy beam lifetime spectrometer is routinely used to perform positron lifetime analysis with a 3 MeV positron beam on thick sample specimens. It is being used for bulk sample analysis and analysis of samples encapsulated in controlled environments for in situ measurements. A second, low energy, microscopically focused, pulsed positron beam for defect analysis by positron lifetime spectroscopy is under development at the LLNL highmore » current positron source. This beam will enable defect-specific, 3-dimensional maps of defect concentration with sub-micron location resolution. When coupled with first principles calculations of defect specific positron lifetimes it will enable new levels of defect concentration mapping and defect identification.« less