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Title: Cable Damage Detection System and Algorithms Using Time Domain Reflectometry

Technical Report ·
DOI:https://doi.org/10.2172/971773· OSTI ID:971773

This report describes the hardware system and the set of algorithms we have developed for detecting damage in cables for the Advanced Development and Process Technologies (ADAPT) Program. This program is part of the W80 Life Extension Program (LEP). The system could be generalized for application to other systems in the future. Critical cables can undergo various types of damage (e.g. short circuits, open circuits, punctures, compression) that manifest as changes in the dielectric/impedance properties of the cables. For our specific problem, only one end of the cable is accessible, and no exemplars of actual damage are available. This work addresses the detection of dielectric/impedance anomalies in transient time domain reflectometry (TDR) measurements on the cables. The approach is to interrogate the cable using time domain reflectometry (TDR) techniques, in which a known pulse is inserted into the cable, and reflections from the cable are measured. The key operating principle is that any important cable damage will manifest itself as an electrical impedance discontinuity that can be measured in the TDR response signal. Machine learning classification algorithms are effectively eliminated from consideration, because only a small number of cables is available for testing; so a sufficient sample size is not attainable. Nonetheless, a key requirement is to achieve very high probability of detection and very low probability of false alarm. The approach is to compare TDR signals from possibly damaged cables to signals or an empirical model derived from reference cables that are known to be undamaged. This requires that the TDR signals are reasonably repeatable from test to test on the same cable, and from cable to cable. Empirical studies show that the repeatability issue is the 'long pole in the tent' for damage detection, because it is has been difficult to achieve reasonable repeatability. This one factor dominated the project. The two-step model-based approach is summarized as follows: Step 1, Cable Modeling: Given input-output TDR signals s(n) and x{sub U}(n) for a cable known to be free of damage, system identification algorithms are used to compute a dynamic prediction-error cable model that has output {cflx x}{sub U}(n). The model is declared valid when the innovations e{sub U}(n) = x{sub U}(n) {cflx x}{sub U}(n) satisfy a statistical zero-mean whiteness test. This validated model output is then used as a known reference to which other cables can be compared. Step 2, Cable Testing: The TDR output signal x{sub D}(n) from a cable under test is compared with the model output {cflx x}{sub U}(n) by computing the innovations e{sub D}(n) = x{sub D}(n) {cflx x}{sub U}(n). The innovations are tested using a short-term whiteness test statistic, which employs a statistical confidence interval. If the cable passes the test, this implies that the model is valid and the cable is declared undamaged. If the cable fails the test, this indicates a model mismatch, which means that the cable's dielectric properties have changed; and this implies that the cable is damaged. The test threshold is adjusted to maximize probability of detection and minimize probability of false alarm according to an empirically determined receiver operating characteristic (ROC) curve. An associated confidence interval on the probability of correct classification is also provided. The effectiveness of the algorithm is demonstrated using measured TDR signals for undamaged and damaged cables. Experimental and algorithmic methods for coping with repeatability issues are presented. The model-based damage detection algorithms have been shown to perform well for some representative examples of real TDR signals acquired using the two-dimensional (2D) mockup fixture. If the damage causes a short circuit, then damage detection performance is generally good to excellent. Examples include the cases demonstrated in this report for cuts and pinholes. If the damage does not cause a short circuit, then damage detection performance is generally poor to fair. Examples include the cases demonstrated in this report for crushes and partial cuts.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
971773
Report Number(s):
LLNL-TR-413970; TRN: US201006%%851
Country of Publication:
United States
Language:
English