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Title: Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111)

Abstract

Scanning tunneling microscopy studies are integrated with development of a realistic atomistic model to both characterize and elucidate the complex mounded morphologies formed by deposition of Ag on Ag(111) at 150 and 180 K. Threefold symmetric lateral shapes of islands and mounds are shown to reflect the influence of a nonuniform step edge barrier inhibiting interlayer transport. Modeling of structure at the mound peaks leads to a sensitive estimate of the magnitude of this large barrier.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Ames Lab., Ames, IA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
970596
Report Number(s):
IS-J 7376
Journal ID: 1098=0121; TRN: US201002%%1304
DOE Contract Number:  
DE-AC02-07CH11358
Resource Type:
Journal Article
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 77; Journal Issue: 033402
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DEPOSITION; EXPLORATION; SCANNING TUNNELING MICROSCOPY; SIMULATION; TRANSPORT

Citation Formats

Li, Maozhi, Chung, P W, Cox, E, Jenks, C J, Thiel, P A, and Evans, J W. Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111). United States: N. p., 2008. Web. doi:10.1103/PhysRevB.77.033402.
Li, Maozhi, Chung, P W, Cox, E, Jenks, C J, Thiel, P A, & Evans, J W. Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111). United States. https://doi.org/10.1103/PhysRevB.77.033402
Li, Maozhi, Chung, P W, Cox, E, Jenks, C J, Thiel, P A, and Evans, J W. 2008. "Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111)". United States. https://doi.org/10.1103/PhysRevB.77.033402.
@article{osti_970596,
title = {Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111)},
author = {Li, Maozhi and Chung, P W and Cox, E and Jenks, C J and Thiel, P A and Evans, J W},
abstractNote = {Scanning tunneling microscopy studies are integrated with development of a realistic atomistic model to both characterize and elucidate the complex mounded morphologies formed by deposition of Ag on Ag(111) at 150 and 180 K. Threefold symmetric lateral shapes of islands and mounds are shown to reflect the influence of a nonuniform step edge barrier inhibiting interlayer transport. Modeling of structure at the mound peaks leads to a sensitive estimate of the magnitude of this large barrier.},
doi = {10.1103/PhysRevB.77.033402},
url = {https://www.osti.gov/biblio/970596}, journal = {Physical Review B},
number = 033402,
volume = 77,
place = {United States},
year = {Thu Jan 03 00:00:00 EST 2008},
month = {Thu Jan 03 00:00:00 EST 2008}
}