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Title: Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances*

Abstract

The transverse emittance of an ion beam describes its transverse size as the particles are transported from a source to a target. It allows for predicting beam losses in limiting apertures and the beam focus size at the target. Various definitions and issues are discussed. The most common and emerging measuring techniques are presented, including their advantages. Several methods of emittance data analysis, their accuracy and trustworthiness, are discussed.

Authors:
 [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Spallation Neutron Source (SNS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
969768
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: 17th International Workshop on ECR Ion Sources and Their Applications, Lanzhou, China, 20060917, 20060921
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; BEAM EMITTANCE; DATA ANALYSIS; ION BEAMS; BEAM DYNAMICS; MEASURING METHODS; ion beams; ion beam transport; ion beam emittance; ion beam diagnostics; emittance analysis

Citation Formats

Stockli, Martin P. Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances*. United States: N. p., 2007. Web.
Stockli, Martin P. Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances*. United States.
Stockli, Martin P. Mon . "Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances*". United States. doi:.
@article{osti_969768,
title = {Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances*},
author = {Stockli, Martin P},
abstractNote = {The transverse emittance of an ion beam describes its transverse size as the particles are transported from a source to a target. It allows for predicting beam losses in limiting apertures and the beam focus size at the target. Various definitions and issues are discussed. The most common and emerging measuring techniques are presented, including their advantages. Several methods of emittance data analysis, their accuracy and trustworthiness, are discussed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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