skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration

Abstract

Piezoresponse force microscopy (PFM) has emerged as a primary tool for imaging, domain engineering, and switching spectroscopy on ferroelectric materials. Quantitative interpretation of PFM data, including measurements of the intrinsic width of the domain walls, determination of geometric parameters of the domain below the tip in local hysteresis loop measurements, as well as interpretation of local switching and coercive biases in terms of material properties and switching mechanisms, requires reliable knowledge on electrostatic and strain field structures produced by the tip. Using linear imaging theory, we develop a theoretical approach for the interpretation of these measurements and the determination of tip parameters from a suitable calibration standard. The resolution and object transfer functions in PFM are derived, and the effect of material parameters on resolution is determined. Closed-form solutions for domain-wall profiles in vertical and lateral PFM and signals from cylindrical and nested cylindrical domains in transversally isotropic piezoelectric are derived for point-charge and sphere-plane geometries of the tip.

Authors:
 [1];  [1];  [1];  [2]
  1. National Academy of Science of Ukraine, Kiev, Ukraine
  2. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
965286
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review B; Journal Volume: 75; Journal Issue: 17
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CALIBRATION STANDARDS; FERROELECTRIC MATERIALS; MICROSCOPY; RESOLUTION; TRANSFER FUNCTIONS; PIEZOELECTRICITY

Citation Formats

Morozovska, A. N., Bravina, S. L., Eliseev, E. A., and Kalinin, Sergei V. Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration. United States: N. p., 2007. Web. doi:10.1103/PhysRevB.75.174109.
Morozovska, A. N., Bravina, S. L., Eliseev, E. A., & Kalinin, Sergei V. Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration. United States. doi:10.1103/PhysRevB.75.174109.
Morozovska, A. N., Bravina, S. L., Eliseev, E. A., and Kalinin, Sergei V. Mon . "Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration". United States. doi:10.1103/PhysRevB.75.174109.
@article{osti_965286,
title = {Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration},
author = {Morozovska, A. N. and Bravina, S. L. and Eliseev, E. A. and Kalinin, Sergei V},
abstractNote = {Piezoresponse force microscopy (PFM) has emerged as a primary tool for imaging, domain engineering, and switching spectroscopy on ferroelectric materials. Quantitative interpretation of PFM data, including measurements of the intrinsic width of the domain walls, determination of geometric parameters of the domain below the tip in local hysteresis loop measurements, as well as interpretation of local switching and coercive biases in terms of material properties and switching mechanisms, requires reliable knowledge on electrostatic and strain field structures produced by the tip. Using linear imaging theory, we develop a theoretical approach for the interpretation of these measurements and the determination of tip parameters from a suitable calibration standard. The resolution and object transfer functions in PFM are derived, and the effect of material parameters on resolution is determined. Closed-form solutions for domain-wall profiles in vertical and lateral PFM and signals from cylindrical and nested cylindrical domains in transversally isotropic piezoelectric are derived for point-charge and sphere-plane geometries of the tip.},
doi = {10.1103/PhysRevB.75.174109},
journal = {Physical Review B},
number = 17,
volume = 75,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}