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Title: X-ray Diffraction Crystal Calibration and Characterization

Abstract

National Security Technologies’ X-ray Laboratory is comprised of a multi-anode Manson type source and a Henke type source that incorporates a dual goniometer and XYZ translation stage. The first goniometer is used to isolate a particular spectral band. The Manson operates up to 10 kV and the Henke up to 20 kV. The Henke rotation stages and translation stages are automated. Procedures have been developed to characterize and calibrate various NIF diagnostics and their components. The diagnostics include X-ray cameras, gated imagers, streak cameras, and other X-ray imaging systems. Components that have been analyzed include filters, filter arrays, grazing incidence mirrors, and various crystals, both flat and curved. Recent efforts on the Henke system are aimed at characterizing and calibrating imaging crystals and curved crystals used as the major component of an X-ray spectrometer. The presentation will concentrate on these results. The work has been done at energies ranging from 3 keV to 16 keV. The major goal was to evaluate the performance quality of the crystal for its intended application. For the imaging crystals we measured the laser beam reflection offset from the X-ray beam and the reflectivity curves. For the curved spectrometer crystal, which was a natural crystal,more » resolving power was critical. It was first necessary to find sources of crystals that had sufficiently narrow reflectivity curves. It was then necessary to determine which crystals retained their resolving power after being thinned and glued to a curved substrate.« less

Authors:
; ;
Publication Date:
Research Org.:
National Security Technologies, LLC (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NA)
OSTI Identifier:
961542
Report Number(s):
DOE/NV/25946-730
TRN: US0903147
DOE Contract Number:  
DE-AC52-06NA25946
Resource Type:
Conference
Resource Relation:
Conference: 36th International Conference on Plasma Science, and 23rd Symposium on Fusion Engineering; San Diego, California; May 31-June 5, 2009
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CALIBRATION; CAMERAS; GONIOMETERS; LASERS; MIRRORS; NATIONAL SECURITY; REFLECTION; REFLECTIVITY; ROTATION; SPECTROMETERS; STREAK CAMERAS; X-RAY DIFFRACTION; X-RAY SPECTROMETERS

Citation Formats

Michael J. Haugh, Richard Stewart, and Nathan Kugland. X-ray Diffraction Crystal Calibration and Characterization. United States: N. p., 2009. Web.
Michael J. Haugh, Richard Stewart, & Nathan Kugland. X-ray Diffraction Crystal Calibration and Characterization. United States.
Michael J. Haugh, Richard Stewart, and Nathan Kugland. Fri . "X-ray Diffraction Crystal Calibration and Characterization". United States. https://www.osti.gov/servlets/purl/961542.
@article{osti_961542,
title = {X-ray Diffraction Crystal Calibration and Characterization},
author = {Michael J. Haugh and Richard Stewart and Nathan Kugland},
abstractNote = {National Security Technologies’ X-ray Laboratory is comprised of a multi-anode Manson type source and a Henke type source that incorporates a dual goniometer and XYZ translation stage. The first goniometer is used to isolate a particular spectral band. The Manson operates up to 10 kV and the Henke up to 20 kV. The Henke rotation stages and translation stages are automated. Procedures have been developed to characterize and calibrate various NIF diagnostics and their components. The diagnostics include X-ray cameras, gated imagers, streak cameras, and other X-ray imaging systems. Components that have been analyzed include filters, filter arrays, grazing incidence mirrors, and various crystals, both flat and curved. Recent efforts on the Henke system are aimed at characterizing and calibrating imaging crystals and curved crystals used as the major component of an X-ray spectrometer. The presentation will concentrate on these results. The work has been done at energies ranging from 3 keV to 16 keV. The major goal was to evaluate the performance quality of the crystal for its intended application. For the imaging crystals we measured the laser beam reflection offset from the X-ray beam and the reflectivity curves. For the curved spectrometer crystal, which was a natural crystal, resolving power was critical. It was first necessary to find sources of crystals that had sufficiently narrow reflectivity curves. It was then necessary to determine which crystals retained their resolving power after being thinned and glued to a curved substrate.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2009},
month = {6}
}

Conference:
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