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Title: Electronic Structure Characterization of Ultra Low-k Carbon Doped Oxide using Soft X-ray Emission Spectroscopy

Journal Article · · Thin Solid Films

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
Sponsoring Organization:
Doe - Office Of Science
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
959976
Report Number(s):
BNL-82962-2009-JA
Journal Information:
Thin Solid Films, Vol. 516
Country of Publication:
United States
Language:
English

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