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Title: Dual-Frequency Resonance-Tracking Atomic Force Microscopy

Authors:
 [1];  [2];  [1];  [2]
  1. ORNL
  2. Asylum Research, Santa Barbara, CA
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
958812
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Nanotechnology; Journal Volume: 18; Journal Issue: 47
Country of Publication:
United States
Language:
English

Citation Formats

Rodriguez, Brian J, Callahan, Clint, Kalinin, Sergei V, and Proksch, Roger. Dual-Frequency Resonance-Tracking Atomic Force Microscopy. United States: N. p., 2007. Web. doi:10.1088/0957-4484/18/47/475504.
Rodriguez, Brian J, Callahan, Clint, Kalinin, Sergei V, & Proksch, Roger. Dual-Frequency Resonance-Tracking Atomic Force Microscopy. United States. doi:10.1088/0957-4484/18/47/475504.
Rodriguez, Brian J, Callahan, Clint, Kalinin, Sergei V, and Proksch, Roger. Mon . "Dual-Frequency Resonance-Tracking Atomic Force Microscopy". United States. doi:10.1088/0957-4484/18/47/475504.
@article{osti_958812,
title = {Dual-Frequency Resonance-Tracking Atomic Force Microscopy},
author = {Rodriguez, Brian J and Callahan, Clint and Kalinin, Sergei V and Proksch, Roger},
abstractNote = {},
doi = {10.1088/0957-4484/18/47/475504},
journal = {Nanotechnology},
number = 47,
volume = 18,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}
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