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U.S. Department of Energy
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Apparatus and system for multivariate spectral analysis

Patent ·
OSTI ID:958090

An apparatus and system for determining the properties of a sample from measured spectral data collected from the sample by performing a method of multivariate spectral analysis. The method can include: generating a two-dimensional matrix A containing measured spectral data; providing a weighted spectral data matrix D by performing a weighting operation on matrix A; factoring D into the product of two matrices, C and S.sup.T, by performing a constrained alternating least-squares analysis of D=CS.sup.T, where C is a concentration intensity matrix and S is a spectral shapes matrix; unweighting C and S by applying the inverse of the weighting used previously; and determining the properties of the sample by inspecting C and S. This method can be used by a spectrum analyzer to process X-ray spectral data generated by a spectral analysis system that can include a Scanning Electron Microscope (SEM) with an Energy Dispersive Detector and Pulse Height Analyzer.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM
Sponsoring Organization:
United States Department of Energy
DOE Contract Number:
AC04-94AL85000
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Number(s):
6,584,413
Application Number:
09/872,740
OSTI ID:
958090
Country of Publication:
United States
Language:
English

References (8)

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Information Extraction: Statistical Analysis to Get the Most from Spectrum Images journal August 2000
A fast non-negativity-constrained least squares algorithm journal September 1997
Antecedents of phubbing: from technological and psychological perspectives journal May 2020
Improved feasible solution algorithms for high breakdown estimation journal March 1999
A highly flexible design and production framework for modularized microelectromechanical systems journal March 1999
Rapid Analysis of Raman Image Data Using Two-Way Multivariate Curve Resolution journal June 1998

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