Material properties limiting the performance of CZT gamma-ray detectors
CdZnTe (CZT) nuclear radiation detectors are advanced sensors that utilize innovative technologies developed for wide band-gap semiconductor industry and microelectronics. They open opportunities for new types of room-temperature operating, field deployable instruments that provide accurate identification of potential radiological threats and timely awareness for both the civilian and military communities. Room-temperature radiation detectors are an emerging technology that relies on the use of high-quality CZT crystals whose availability is currently limited by material non-uniformities and the presence of extended defects. To address these issues, which are most critical to CZT sensor developments, we developed X-ray mapping and IR transmission microscopy systems to characterize both CZT crystals and devices. Since a customized system is required for such X-ray measurements, we use synchrotron radiation beams available at BNL's National Synchrotron Light Source. A highly-collimated and high-intensity X-ray beam supports measurements of areas as small as 10 x 10 {micro}m{sup 2}, and allowed us to see fluctuations in collected charge over the entire area of the detector in a reasonable time. The IR microscopy system allows for 3D visualization of Te inclusions and other extended defects. In this paper, we describe the experimental techniques used in our measurements and typical results obtained from CZT samples produced by different suppliers.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- Doe - National Nuclear Security Administration
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 950455
- Report Number(s):
- BNL-82134-2009-CP; R&D Project: 12813; 400403709; TRN: US0902002
- Resource Relation:
- Conference: 43rd Annual GOMAC Tech Conference; Orlando, Florida; 20090316 through 20090319
- Country of Publication:
- United States
- Language:
- English
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