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Title: (Cd,Mn)Te detectors for characterization of x-ray emissions generated during laser-driven fusion experiments

Conference ·
OSTI ID:950010

We present our measurements of (Cd,Mn)Te photoconductive detectors (PCDs), fabricated for the goal of measuring both the temporal and spectral dependences of X-ray emissions generated from laser-illuminated targets during the inertial confinement fusion experiments. Our Cd{sub 1-x}Mn{sub x}Te (x = 0.05) single crystals, doped with V, were grown using a vertical Bridgman method and, subsequently, annealed in Cd for the highest resistivity ({approx}10{sup 10} {Omega}cm) and a good mobility-lifetime product ({approx}10{sup -3} cm{sup 2}/V). The 1-mm- and 2.3-mm-thick detectors were placed in the same housing as two 1-mm-thick diamond PCDs. All devices were pre-screened by a 7.6-mm-thick Be X-ray filter with a frequency cutoff of 1 keV. The incident shots from the OMEGA laser were 1-ns-long square pulses with energies ranging from 2.3 kJ to 22.6 kJ, and the PCDs were biased with 5000 V/cm. The response amplitudes and rise times of our (Cd,Mn)Te PCDs were comparable with the diamond detector performance, while the decay times were 4 to 10 times longer and in the 2-5 ns range. We observed two X-ray emission events separated by 1.24 ns. The first was identified as caused by heating of the target and creating a hot corona, while the second one was from the resulting compressed core. For comparison purposes, our testing was performed using {approx}1 keV X-ray photons, optimal for the diamond PCD. According to the presented simulations, however, at X-ray energies >10 keV diamond absorption efficiency drops to <50%, whereas for (Cd,Mn)Te the drop occurs at {approx}100 keV with near perfect, 100% absorption, up to 50 keV.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
Doe - National Nuclear Security Administration
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
950010
Report Number(s):
BNL-82064-2009-CP; R&D Project: 02806; YN0100000; TRN: US0901933
Resource Relation:
Conference: IEEE Dresden 2008; Dresden, Germany; 20081019 through 20081025
Country of Publication:
United States
Language:
English