Nondestructive analysis of phase evolution and microstructure development in Ag/(Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x} composite superconductor by 25 keV transmission x-ray diffraction.
X-ray diffraction (XRD) measurements were made on silver-sheathed (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x} (Ag/Bi-2223) composite superconductor using 25 keV X-rays produced by an insertion device beamline at a third generation synchrotron. These measurements, performed on fully sheathed multifilament-type Ag/Bi-2223 wire specimens, provided high resolution diffraction patterns that revealed (1) the phases present in the cores of the superconducting filaments and (2) the nature and quality of the Bi-2223 grain colony texture. In addition to the Bi-2223 phase, we were able to detect and to monitor specimen-to-specimen variations in the relative amounts of Bi-2212, Bi-2201, and the '3221' phase. The scattering geometry used (X-ray beam perpendicular to the Ag/Bi-2223 conductor rolling direction) resulted in the detection of several remarkably intense diffraction lines of Bi-2223, most notably the (2 0 0)/(0 2 0) pair, that were highly useful for recording pole figure maps evidencing the contiguous fiber texture microstructure of the Bi-2223 grain colonies. The nondestructive nature of the 25 keV transmission XRD method offers many advantages for the comprehensive study of phase evolution and microstructure development in Ag/Bi-2223 composite conductors.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- EE; USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 949539
- Report Number(s):
- ANL/CMT/JA-41807; TRN: US1003570
- Journal Information:
- Physica C, Vol. 382, Issue 1 ; Oct. 15, 2002
- Country of Publication:
- United States
- Language:
- ENGLISH
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