Growth and properties of YBCO thin films on polycrystalline Ag substrates by inclined substrate pulsed laser ablation.
Fully c-axis-oriented YBCO films were directly deposited on polycrystalline silver substrates by inclined substrate pulsed laser ablation. The orientation and microstructure of the YBCO films were characterized by x-ray diffraction 2{Theta}-scans, {Omega}-scans and pole figure analysis. Surface morphology was examined by scanning electron microscopy. Irregular-mosaic-shaped supergrains were observed in the films. Raman spectroscopy was used to evaluate the quality of the YBCO films. The superconducting transition temperature ({Tc}) and the critical current density (J{sub c}) of the films were determined by inductive and transport measurements, respectively. {Tc} = 91 K with sharp transition and J{sub c} = 2.7 x 10{sup 5} A cm-2 at 77 K in zero field were obtained on a film that was 0.14 {mu}m thick, 5 mm wide and 10 mm long. This work demonstrated a promising approach to obtain high-J{sub c} YBCO films on nontextured polycrystalline silver substrate.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- EE
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 949512
- Report Number(s):
- ANL/ET/JA-41648; SUSTEF; TRN: US1003561
- Journal Information:
- Supercond. Sci. Technol., Vol. 15, Issue 2002; ISSN 0953-2048
- Country of Publication:
- United States
- Language:
- ENGLISH
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