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Title: X-ray Conversion Efficiency of high-Z hohlraum wall materials for indirect drive ignition

Journal Article · · Physics of Plasma , vol. 15, no. 7, July 1, 2008, pp. 072706
DOI:https://doi.org/10.1063/1.2943700· OSTI ID:944359

We measure the conversion efficiency of 351 nm laser light to soft x-rays (0.1-5 keV) for Au, U and high Z mixtures 'cocktails' used for hohlraum wall materials in indirect drive ICF. We use spherical targets in a direct drive geometry, flattop laser pulses and laser smoothing with phase plates to achieve constant and uniform laser intensities of 10{sup 14} and 10{sup 15} W/cm{sup 2} over the target surface that are relevant for the future ignition experiments on NIF. The absolute time and spectrally-resolved radiation flux is measured with a multichannel soft x-ray power diagnostic. The conversion efficiency is then calculated by dividing the measured x-ray power by the incident laser power from which the measured laser backscattering losses is subtracted. After {approx}0.5 ns, the time resolved x-ray conversion efficiency reaches a slowly increasing plateau of 95% at 10{sup 14} W/cm{sup 2} laser intensity and of 80% at 10{sup 15} W/cm{sup 2}. The M-band flux (2-5 keV) is negligible at 10{sup 14} W/cm{sup 2} reaching {approx}1% of the total x-ray flux for all target materials. In contrast, the M-band flux is significant and depends on the target material at 10{sup 15} W/cm{sup 2} laser intensity, reaching values between 10% of the total flux for U and 27% for Au. Our LASNEX simulations show good agreement in conversion efficiency and radiated spectra with data when using XSN atomic physics model and a flux limiter of 0.15, but they underestimate the generated M-band flux.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
944359
Report Number(s):
LLNL-JRNL-402374; TRN: US0900573
Journal Information:
Physics of Plasma , vol. 15, no. 7, July 1, 2008, pp. 072706, Vol. 15, Issue 7
Country of Publication:
United States
Language:
English

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