Real-time X-ray Diffraction Measurements of Shocked Polycrystalline Tin and Aluminum
A new, fast, single-pulse x-ray diffraction (XRD) diagnostic for determining phase transitions in shocked polycrystalline materials has been developed. The diagnostic consists of a 37-stage Marx bank high-voltage pulse generator coupled to a needle-and-washer electron beam diode via coaxial cable, producing line and bremsstrahlung x-ray emission in a 35-ns pulse. The characteristic Kα lines from the selected anodes of silver and molybdenum are used to produce the diffraction patterns, with thin foil filters employed to remove the characteristic Kβ line emission. The x-ray beam passes through a pinhole collimator and is incident on the sample with an approximately 3-mm by 6-mm spot and 1° full-width-half-maximum (FWHM) angular divergence in a Bragg-reflecting geometry. For the experiments described in this report, the angle between the incident beam and the sample surface was 8.5°. A Debye-Scherrer diffraction image was produced on a phosphor located 76 mm from the polycrystalline sample surface. The phosphor image was coupled to a charge-coupled device (CCD) camera through a coherent fiberoptic bundle. Dynamic single-pulse XRD experiments were conducted with thin foil samples of tin, shock loaded with a 1-mm vitreous carbon back window. Detasheet high explosive with a 2-mm-thick aluminum buffer was used to shock the sample. Analysis of the dynamic shock-loaded tin XRD images revealed a phase transformation of the tin beta phase into an amorphous or liquid state. Identical experiments with shock-loaded aluminum indicated compression of the face-centered-cubic (fcc) aluminum lattice with no phase transformation.
- Research Organization:
- National Security Technologies, LLC (NSTec), Mercury, NV (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NA)
- DOE Contract Number:
- DE-AC52-06NA25946
- OSTI ID:
- 943979
- Report Number(s):
- DOE/NV/25946-498; RSINAK; TRN: US0900715
- Journal Information:
- Review of Scientific Instruments, Vol. 79, Issue 11; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ALUMINIUM
ANODES
BREMSSTRAHLUNG
BUFFERS
CARBON
CHARGE-COUPLED DEVICES
CHEMICAL EXPLOSIVES
COAXIAL CABLES
COLLIMATORS
COMPRESSION
DIFFRACTION
ELECTRON BEAMS
FCC LATTICES
GEOMETRY
HIGH-VOLTAGE PULSE GENERATORS
MOLYBDENUM
PHASE TRANSFORMATIONS
PHOSPHORS
X-RAY DIFFRACTION
X-ray diffraction
polycrystalline
tin
aluminum