Transmission electron microscopy study of (103)-oriented epitaxial SrBisub2Nbsub2Osub9 films grown on (111) SrTiOsub3 and (111) SrTiOsub3.
Portions of the same epitaxial (103)-oriented SrBi{sub 2}Nb{sub 2}O{sub 9} film grown on (111) SrTiO{sub 3} for which we recently reported the highest remanent polarization (P{sub r}) ever achieved in SrBi{sub 2}Nb{sub 2}O{sub 9} (or SrBi{sub 2}Ta{sub 2}O{sub 9}) films, i.e., P{sub r} = 15.7 iC/cm{sup 2}, have been characterized microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi{sub 2}Nb{sub 2}O{sub 9} grows with its c axis tilted 57{sup o} from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins' c axes nominally aligned with the three <100> SrTiO{sub 3} directions. (103) SrBi{sub 2}Nb{sub 2}O{sub 9} films with and without an underlying epitaxial SrRuO{sub 3} bottom electrode have been studied. Dark-field TEM imaging over a 12 im{sup 2} area shows no evidence of second phases (crystalline or amorphous). A high density of out-of-phase boundaries exists in the films.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 943062
- Report Number(s):
- ANL/MSD/JA-37190; JMREEE; TRN: US201002%%568
- Journal Information:
- J. Mater. Res., Vol. 16, Issue 2 ; Feb. 2001; ISSN 0884-2914
- Country of Publication:
- United States
- Language:
- ENGLISH
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