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Title: Local atomic environment of Cu : CdTe thin film alloys.

Abstract

We have used X-ray absorption spectroscopy of the K-edge of each element in a Cd{sub 0.85}Cu{sub 0.15}Te thin film to investigate the local atomic structure around each constituent element. X-ray absorption near edge spectra reveal that the local electronic structure around Cd and Te atoms is similar to that of undoped CdTe, while that of Cu is different from that encountered in Cu metal. X-ray absorption fine structure spectra show that while the Cd near neighbor environment is similar to that of undoped CdTe, the Te environment shows differences compared with that found in undoped CdTe, consistent with Cu entering substitutionally for Cd. The Cu nearest neighbor environment suggests the presence of Cu-metal ligands characteristic of Cu metal clusters. These results imply the occurrence of microscopic phase separation in this material in variance with X-ray diffraction results that show a single crystalline phase.

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); FOR
OSTI Identifier:
942860
Report Number(s):
ANL/MSD/JA-35403
Journal ID: ISSN 0026-2692; MICEB9; TRN: US200923%%649
DOE Contract Number:  
DE-AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Microelectron. J.
Additional Journal Information:
Journal Volume: 31; Journal Issue: 6 ; Jun. 2000; Journal ID: ISSN 0026-2692
Country of Publication:
United States
Language:
ENGLISH
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; ABSORPTION; ABSORPTION SPECTROSCOPY; ALLOYS; ATOMS; CADMIUM; CADMIUM TELLURIDES; COPPER; CRYSTAL DOPING; ELECTRONIC STRUCTURE; ELEMENTS; FINE STRUCTURE; LIGANDS; MATERIALS; METALS; SEMICONDUCTOR MATERIALS; SOLAR CELLS; SPECTRA; TELLURIUM; THIN FILMS; X-RAY DIFFRACTION

Citation Formats

Mustre de Leon, J., Espinosa, F. J., Perez, V. A., Jimenez-Sandoval, S., Lopez-Lopez, S., Montano, P. A., Materials Science Division, Cinvestav-Merida, Cinvestav-Queretaro, and Cinvestav-Mexico. Local atomic environment of Cu : CdTe thin film alloys.. United States: N. p., 2000. Web. doi:10.1016/S0026-2692(00)00010-0.
Mustre de Leon, J., Espinosa, F. J., Perez, V. A., Jimenez-Sandoval, S., Lopez-Lopez, S., Montano, P. A., Materials Science Division, Cinvestav-Merida, Cinvestav-Queretaro, & Cinvestav-Mexico. Local atomic environment of Cu : CdTe thin film alloys.. United States. doi:10.1016/S0026-2692(00)00010-0.
Mustre de Leon, J., Espinosa, F. J., Perez, V. A., Jimenez-Sandoval, S., Lopez-Lopez, S., Montano, P. A., Materials Science Division, Cinvestav-Merida, Cinvestav-Queretaro, and Cinvestav-Mexico. Thu . "Local atomic environment of Cu : CdTe thin film alloys.". United States. doi:10.1016/S0026-2692(00)00010-0.
@article{osti_942860,
title = {Local atomic environment of Cu : CdTe thin film alloys.},
author = {Mustre de Leon, J. and Espinosa, F. J. and Perez, V. A. and Jimenez-Sandoval, S. and Lopez-Lopez, S. and Montano, P. A. and Materials Science Division and Cinvestav-Merida and Cinvestav-Queretaro and Cinvestav-Mexico},
abstractNote = {We have used X-ray absorption spectroscopy of the K-edge of each element in a Cd{sub 0.85}Cu{sub 0.15}Te thin film to investigate the local atomic structure around each constituent element. X-ray absorption near edge spectra reveal that the local electronic structure around Cd and Te atoms is similar to that of undoped CdTe, while that of Cu is different from that encountered in Cu metal. X-ray absorption fine structure spectra show that while the Cd near neighbor environment is similar to that of undoped CdTe, the Te environment shows differences compared with that found in undoped CdTe, consistent with Cu entering substitutionally for Cd. The Cu nearest neighbor environment suggests the presence of Cu-metal ligands characteristic of Cu metal clusters. These results imply the occurrence of microscopic phase separation in this material in variance with X-ray diffraction results that show a single crystalline phase.},
doi = {10.1016/S0026-2692(00)00010-0},
journal = {Microelectron. J.},
issn = {0026-2692},
number = 6 ; Jun. 2000,
volume = 31,
place = {United States},
year = {2000},
month = {6}
}