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Title: Preparation of damage-free glass TEM specimens.

Abstract

A jet polishing technique to chemically thin glass specimens for transmission electron microscopy (TEM) after a preliminary mechanical dimpling step has been developed. Slightly modified commercial equipment is used with automatic optical termination of the polishing process to produce foils exhibiting large, high quality, electron transparent regions.

Authors:
;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
942479
Report Number(s):
ANL/MSD/JA-31870
Journal ID: ISSN 0304-3991; ULTRD6; TRN: US200916%%492
DOE Contract Number:  
DE-AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 83; Journal Issue: 1-2 ; May 2000; Journal ID: ISSN 0304-3991
Country of Publication:
United States
Language:
ENGLISH
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; SAMPLE PREPARATION; GLASS; POLISHING; TRANSMISSION ELECTRON MICROSCOPY

Citation Formats

Kestel, B. J., and Materials Science Division. Preparation of damage-free glass TEM specimens.. United States: N. p., 2000. Web. doi:10.1016/S0304-3991(99)00173-4.
Kestel, B. J., & Materials Science Division. Preparation of damage-free glass TEM specimens.. United States. doi:10.1016/S0304-3991(99)00173-4.
Kestel, B. J., and Materials Science Division. Mon . "Preparation of damage-free glass TEM specimens.". United States. doi:10.1016/S0304-3991(99)00173-4.
@article{osti_942479,
title = {Preparation of damage-free glass TEM specimens.},
author = {Kestel, B. J. and Materials Science Division},
abstractNote = {A jet polishing technique to chemically thin glass specimens for transmission electron microscopy (TEM) after a preliminary mechanical dimpling step has been developed. Slightly modified commercial equipment is used with automatic optical termination of the polishing process to produce foils exhibiting large, high quality, electron transparent regions.},
doi = {10.1016/S0304-3991(99)00173-4},
journal = {Ultramicroscopy},
issn = {0304-3991},
number = 1-2 ; May 2000,
volume = 83,
place = {United States},
year = {2000},
month = {5}
}