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Title: Differential aperture x-ray microscopy near Te precipitates in CdZnTe.

Abstract

We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 0.25 {micro}m resolution in the scanning directions and 1 {micro}m resolution in depth) at depths of up to 35 {micro}m deep normal to the surface. We find very little crystal strain (< 10{sup -3}) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns. Furthermore, observed crystal strains are limited to 5 x 10{sup -3} or less in regions near the microhardness indent.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
941489
Report Number(s):
ANL/XSD/JA-62893
TRN: US200825%%550
DOE Contract Number:  
DE-AC02-06CH11357
Resource Type:
Journal Article
Country of Publication:
United States
Language:
ENGLISH
Subject:
36 MATERIALS SCIENCE; APERTURES; MICROHARDNESS; MICROSCOPY; PHYSICS; RESOLUTION; ROTATION; SPATIAL RESOLUTION; STRAINS

Citation Formats

Miller, E. A., Toloczko, M., Seifert, C. E., Seifert, A., Liu, W., Bliss, M., X-Ray Science Division, and PNNL. Differential aperture x-ray microscopy near Te precipitates in CdZnTe.. United States: N. p., 2007. Web. doi:10.1117/12.738959.
Miller, E. A., Toloczko, M., Seifert, C. E., Seifert, A., Liu, W., Bliss, M., X-Ray Science Division, & PNNL. Differential aperture x-ray microscopy near Te precipitates in CdZnTe.. United States. doi:10.1117/12.738959.
Miller, E. A., Toloczko, M., Seifert, C. E., Seifert, A., Liu, W., Bliss, M., X-Ray Science Division, and PNNL. Mon . "Differential aperture x-ray microscopy near Te precipitates in CdZnTe.". United States. doi:10.1117/12.738959.
@article{osti_941489,
title = {Differential aperture x-ray microscopy near Te precipitates in CdZnTe.},
author = {Miller, E. A. and Toloczko, M. and Seifert, C. E. and Seifert, A. and Liu, W. and Bliss, M. and X-Ray Science Division and PNNL},
abstractNote = {We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 0.25 {micro}m resolution in the scanning directions and 1 {micro}m resolution in depth) at depths of up to 35 {micro}m deep normal to the surface. We find very little crystal strain (< 10{sup -3}) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns. Furthermore, observed crystal strains are limited to 5 x 10{sup -3} or less in regions near the microhardness indent.},
doi = {10.1117/12.738959},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}