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Title: Differential aperture x-ray microscopy near Te precipitates in CdZnTe.

Abstract

We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 0.25 {micro}m resolution in the scanning directions and 1 {micro}m resolution in depth) at depths of up to 35 {micro}m deep normal to the surface. We find very little crystal strain (< 10{sup -3}) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns. Furthermore, observed crystal strains are limited to 5 x 10{sup -3} or less in regions near the microhardness indent.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
941489
Report Number(s):
ANL/XSD/JA-62893
TRN: US200825%%550
DOE Contract Number:
DE-AC02-06CH11357
Resource Type:
Journal Article
Country of Publication:
United States
Language:
ENGLISH
Subject:
36 MATERIALS SCIENCE; APERTURES; MICROHARDNESS; MICROSCOPY; PHYSICS; RESOLUTION; ROTATION; SPATIAL RESOLUTION; STRAINS

Citation Formats

Miller, E. A., Toloczko, M., Seifert, C. E., Seifert, A., Liu, W., Bliss, M., X-Ray Science Division, and PNNL. Differential aperture x-ray microscopy near Te precipitates in CdZnTe.. United States: N. p., 2007. Web. doi:10.1117/12.738959.
Miller, E. A., Toloczko, M., Seifert, C. E., Seifert, A., Liu, W., Bliss, M., X-Ray Science Division, & PNNL. Differential aperture x-ray microscopy near Te precipitates in CdZnTe.. United States. doi:10.1117/12.738959.
Miller, E. A., Toloczko, M., Seifert, C. E., Seifert, A., Liu, W., Bliss, M., X-Ray Science Division, and PNNL. Mon . "Differential aperture x-ray microscopy near Te precipitates in CdZnTe.". United States. doi:10.1117/12.738959.
@article{osti_941489,
title = {Differential aperture x-ray microscopy near Te precipitates in CdZnTe.},
author = {Miller, E. A. and Toloczko, M. and Seifert, C. E. and Seifert, A. and Liu, W. and Bliss, M. and X-Ray Science Division and PNNL},
abstractNote = {We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 0.25 {micro}m resolution in the scanning directions and 1 {micro}m resolution in depth) at depths of up to 35 {micro}m deep normal to the surface. We find very little crystal strain (< 10{sup -3}) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns. Furthermore, observed crystal strains are limited to 5 x 10{sup -3} or less in regions near the microhardness indent.},
doi = {10.1117/12.738959},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}
  • We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 250 nm resolution in the scanning directions and 1 μm resolution in depth) at depths of up to 35 μm deep normal to the surface. We find very little crystal strain (< 10-3) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns.more » Furthermore, observed crystal strains are limited to 5 x 10-3 or less in regions near the microhardness indent.« less
  • Spatially resolved strain distributions in the NiAl matrix and the ~550-nm Mo fibers of a NiAl-Mo eutectic were investigated by micro-beam X-ray diffraction. Position sensitive d-spacings for the individual phases were obtained from Laue patterns. For embedded Mo fibers, the measured elastic strain is consistent with the predicted thermal mismatch strain between the NiAl and Mo phases. However, when the NiAl matrix is etched back to expose Mo micro-pillars, the d-spacing increases to that of unconstrained Mo, indicating release of the compressive residual strain in the Mo fibers.
  • Spatially resolved strain distributions in the NiAl matrix and the {approx}550-1000 nm Mo fibers of a NiAl-Mo eutectic were investigated by microbeam x-ray diffraction. Position sensitive d-spacings for the individual phases were obtained from spatially resolved and energy-resolved Laue patterns. For embedded Mo fibers, the measured elastic strain is consistent with the predicted thermal mismatch strain between the NiAl and Mo phases. However, when the NiAl matrix is etched back to expose Mo micropillars, the d-spacing increases to that of unconstrained Mo, indicating release of the compressive residual strain in the Mo fibers.
  • A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture X-ray microscopy (DAXM) on a sparse grid across the microstructure volume of interest. Resulting orientation data is clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi Implicit Interface Method (VIIM), progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surfacemore » reconstruction error provides an objective termination criterion for boundary relaxation.« less
  • A multistep, non-destructive grain morphology reconstruction methodology that is applicable to near-surface volumes is developed and tested on synthetic grain structures. This approach probes the subsurface crystal orientation using differential aperture x-ray microscopy on a sparse grid across the microstructure volume of interest. Resulting orientation data are clustered according to proximity in physical and orientation space and used as seed points for an initial Voronoi tessellation to (crudely) approximate the grain morphology. Curvature-driven grain boundary relaxation, simulated by means of the Voronoi implicit interface method, progressively improves the reconstruction accuracy. The similarity between bulk and readily accessible surface reconstruction errormore » provides an objective termination criterion for boundary relaxation.« less