Measurement of the x-ray mass attenuation coefficient and determination of the imaginary component of the atomic form-factor of tin over the energy range of 29 keV-60 keV.
We use the x-ray extended-range technique (XERT) [C. T. Chantler et al., Phys. Rev. A 64, 062506 (2001)] to measure the mass attenuation coefficients of tin in the x-ray energy range of 29-60 keV to 0.04-3 % accuracy, and typically in the range 0.1-0.2 %. Measurements made over an extended range of the measurement parameter space are critically examined to identify, quantify, and correct a number of potential experimental systematic errors. These results represent the most extensive experimental data set for tin and include absolute mass attenuation coefficients in the regions of x-ray absorption fine structure, extended x-ray absorption fine structure, and x-ray absorption near-edge structure. The imaginary component of the atomic form factor f{sub 2} is derived from the photoelectric absorption after subtracting calculated Rayleigh and Compton scattering cross sections from the total attenuation. Comparison of the result with tabulations of calculated photoelectric absorption coefficients indicates that differences of 1-2 % persist between calculated and observed values.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); FOR
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 939311
- Report Number(s):
- ANL/CHM/JA-57502; PLRAAN; TRN: US200823%%8
- Journal Information:
- Phys. Rev. A, Vol. 75, Issue 2007; ISSN 1050-2947
- Country of Publication:
- United States
- Language:
- ENGLISH
Similar Records
Measurement of the x-ray mass attenuation coefficient and determination of the imaginary component of the atomic form factor of molybdenum over the 13.5-41.5-keV energy range
Measurement of the x-ray mass attenuation coefficient and the imaginary part of the form factor of silicon using synchrotron radiation