skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Measurement of the x-ray mass attenuation coefficient and determination of the imaginary component of the atomic form-factor of tin over the energy range of 29 keV-60 keV.

Abstract

We use the x-ray extended-range technique (XERT) [C. T. Chantler et al., Phys. Rev. A 64, 062506 (2001)] to measure the mass attenuation coefficients of tin in the x-ray energy range of 29-60 keV to 0.04-3 % accuracy, and typically in the range 0.1-0.2 %. Measurements made over an extended range of the measurement parameter space are critically examined to identify, quantify, and correct a number of potential experimental systematic errors. These results represent the most extensive experimental data set for tin and include absolute mass attenuation coefficients in the regions of x-ray absorption fine structure, extended x-ray absorption fine structure, and x-ray absorption near-edge structure. The imaginary component of the atomic form factor f{sub 2} is derived from the photoelectric absorption after subtracting calculated Rayleigh and Compton scattering cross sections from the total attenuation. Comparison of the result with tabulations of calculated photoelectric absorption coefficients indicates that differences of 1-2 % persist between calculated and observed values.

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); FOR
OSTI Identifier:
939311
Report Number(s):
ANL/CHM/JA-57502
Journal ID: ISSN 1050-2947; PLRAAN; TRN: US200823%%8
DOE Contract Number:
DE-AC02-06CH11357
Resource Type:
Journal Article
Resource Relation:
Journal Name: Phys. Rev. A; Journal Volume: 75; Journal Issue: 2007
Country of Publication:
United States
Language:
ENGLISH
Subject:
36 MATERIALS SCIENCE; TIN; MASS; ATTENUATION; FORM FACTORS; KEV RANGE 10-100; X RADIATION; PHOTOELECTRIC EFFECT

Citation Formats

de Jonge, M. D., Tran, C. Q., Chantler, C. T., Barnea, Z., Dhal, B. P., Paterson, D., Kanter, E. P., Southworth, S. H., Young, L., Beno, M. A., Linton, J. A., Jennings, G., Univ. of Melbourne, and Australian Synchrotron Project. Measurement of the x-ray mass attenuation coefficient and determination of the imaginary component of the atomic form-factor of tin over the energy range of 29 keV-60 keV.. United States: N. p., 2007. Web. doi:10.1103/PhysRevA.75.032702.
de Jonge, M. D., Tran, C. Q., Chantler, C. T., Barnea, Z., Dhal, B. P., Paterson, D., Kanter, E. P., Southworth, S. H., Young, L., Beno, M. A., Linton, J. A., Jennings, G., Univ. of Melbourne, & Australian Synchrotron Project. Measurement of the x-ray mass attenuation coefficient and determination of the imaginary component of the atomic form-factor of tin over the energy range of 29 keV-60 keV.. United States. doi:10.1103/PhysRevA.75.032702.
de Jonge, M. D., Tran, C. Q., Chantler, C. T., Barnea, Z., Dhal, B. P., Paterson, D., Kanter, E. P., Southworth, S. H., Young, L., Beno, M. A., Linton, J. A., Jennings, G., Univ. of Melbourne, and Australian Synchrotron Project. Mon . "Measurement of the x-ray mass attenuation coefficient and determination of the imaginary component of the atomic form-factor of tin over the energy range of 29 keV-60 keV.". United States. doi:10.1103/PhysRevA.75.032702.
@article{osti_939311,
title = {Measurement of the x-ray mass attenuation coefficient and determination of the imaginary component of the atomic form-factor of tin over the energy range of 29 keV-60 keV.},
author = {de Jonge, M. D. and Tran, C. Q. and Chantler, C. T. and Barnea, Z. and Dhal, B. P. and Paterson, D. and Kanter, E. P. and Southworth, S. H. and Young, L. and Beno, M. A. and Linton, J. A. and Jennings, G. and Univ. of Melbourne and Australian Synchrotron Project},
abstractNote = {We use the x-ray extended-range technique (XERT) [C. T. Chantler et al., Phys. Rev. A 64, 062506 (2001)] to measure the mass attenuation coefficients of tin in the x-ray energy range of 29-60 keV to 0.04-3 % accuracy, and typically in the range 0.1-0.2 %. Measurements made over an extended range of the measurement parameter space are critically examined to identify, quantify, and correct a number of potential experimental systematic errors. These results represent the most extensive experimental data set for tin and include absolute mass attenuation coefficients in the regions of x-ray absorption fine structure, extended x-ray absorption fine structure, and x-ray absorption near-edge structure. The imaginary component of the atomic form factor f{sub 2} is derived from the photoelectric absorption after subtracting calculated Rayleigh and Compton scattering cross sections from the total attenuation. Comparison of the result with tabulations of calculated photoelectric absorption coefficients indicates that differences of 1-2 % persist between calculated and observed values.},
doi = {10.1103/PhysRevA.75.032702},
journal = {Phys. Rev. A},
number = 2007,
volume = 75,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}
  • We use the x-ray extended-range technique (XERT) [C. T. Chantler et al., Phys. Rev. A 64, 062506 (2001)] to measure the mass attenuation coefficients of tin in the x-ray energy range of 29-60 keV to 0.04-3 % accuracy, and typically in the range 0.1-0.2 %. Measurements made over an extended range of the measurement parameter space are critically examined to identify, quantify, and correct a number of potential experimental systematic errors. These results represent the most extensive experimental data set for tin and include absolute mass attenuation coefficients in the regions of x-ray absorption fine structure, extended x-ray absorption finemore » structure, and x-ray absorption near-edge structure. The imaginary component of the atomic form factor f{sub 2} is derived from the photoelectric absorption after subtracting calculated Rayleigh and Compton scattering cross sections from the total attenuation. Comparison of the result with tabulations of calculated photoelectric absorption coefficients indicates that differences of 1-2 % persist between calculated and observed values.« less
  • We use the x-ray extended-range technique (XERT) [Chantler et al., Phys. Rev. A 64, 062506 (2001)] to measure the mass attenuation coefficients of molybdenum in the x-ray energy range of 13.5-41.5 keV to 0.02-0.15 % accuracy. Measurements made over an extended range of the measurement parameter space are critically examined to identify, quantify, and correct where necessary a number of experimental systematic errors. These results represent the most extensive experimental data set for molybdenum and include absolute mass attenuation coefficients in the regions of the x-ray absorption fine structure (XAFS) and x-ray-absorption near-edge structure (XANES). The imaginary component of themore » atomic form-factor f{sub 2} is derived from the photoelectric absorption after subtracting calculated Rayleigh and Compton scattering cross sections from the total attenuation. Comparison of the result with tabulations of calculated photoelectric absorption coefficients indicates that differences of 1-15 % persist between the calculated and observed values.« less
  • The x-ray mass attenuation coefficients of zinc are measured in a high-accuracy experiment between 7.2 and 15.2 keV with an absolute accuracy of 0.044% and 0.197%. This is the most accurate determination of any attenuation coefficient on a bending-magnet beamline and reduces the absolute uncertainty by a factor of 3 compared to earlier work by advances in integrated column density determination and the full-foil mapping technique described herein. We define a relative accuracy of 0.006%, which is not the same as either the precision or the absolute accuracy. Relative accuracy is the appropriate parameter for standard implementation of analysis ofmore » near-edge spectra. Values of the imaginary components f'' of the x-ray form factor of zinc are derived. Observed differences between the measured mass attenuation coefficients and various theoretical calculations reach a maximum of about 5% at the absorption edge and up to 2% further than 1 keV away from the edge. The measurements invite improvements in the theoretical calculations of mass attenuation coefficients of zinc.« less
  • We used the x-ray extended-range technique to measure the x-ray mass attenuation coefficients of silicon with an accuracy between 0.27% and 0.5% in the 5 keV-20 keV energy range. Subtraction of the x-ray scattering contribution enabled us to derive the corresponding x-ray photoelectric absorption coefficients and determine the absolute value of the imaginary part of the atomic form factor of silicon. Discrepancies between the experimental values of the mass attenuation coefficients and theoretically calculated values are discussed. New approaches to the theoretical calculation will be required to match the precision and accuracy of the experimental results.