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Title: Strains, stresses and elastic properties in polycrystallinemetallic thin films: in situ deformation combined with x-ray diffractionand simulation experiments

Abstract

X-ray diffraction is used in combination with tensiletesting for measuring elastic properties of metallic thin films. Sizeeffect, elastic anisotropy and grain morphologies are considered in allthese experiments and supported by different kind of numericalsimulations operating at different length scales. Such instrumentalstudies are time consuming even if synchrotron sources are used. Newexperiments are under progress for reducing acquisition data andimproving precision on strain measurements. After introducing briefly themain principles and results of our techniques, first promisingmeasurements on nanometric W/Cu multilayers using 2D CCD detectors andhigh monochromatic flux at the Advanced Light Source Berkeley (USA) onbeam line 11.3.1 are presented. In addition, simulation experiments foranalyzing elasticity in textured gold film are discussed.

Authors:
; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
COLLABORATION - U.Poitiers/France
Sponsoring Org.:
USDOE
OSTI Identifier:
932790
Report Number(s):
LBNL-62842
R&D Project: A580ES; BnR: KC0204016
DOE Contract Number:  
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Science Forum; Journal Volume: 524-525; Related Information: Journal Publication Date: 2006
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Elasticity thin films size effects diffraction synchrotrontensile testing simulation

Citation Formats

Goudeau, P., Faurie, D., Girault, B., Renault, P.-O., Le Bourhis,E., Villain, P., Badawi, F., Castelnau, O., Brenner, R., Bechade, J.-L., Geandier, G., and Tamura, N. Strains, stresses and elastic properties in polycrystallinemetallic thin films: in situ deformation combined with x-ray diffractionand simulation experiments. United States: N. p., 2006. Web. doi:10.4028/www.scientific.net/MSF.524-525.735.
Goudeau, P., Faurie, D., Girault, B., Renault, P.-O., Le Bourhis,E., Villain, P., Badawi, F., Castelnau, O., Brenner, R., Bechade, J.-L., Geandier, G., & Tamura, N. Strains, stresses and elastic properties in polycrystallinemetallic thin films: in situ deformation combined with x-ray diffractionand simulation experiments. United States. doi:10.4028/www.scientific.net/MSF.524-525.735.
Goudeau, P., Faurie, D., Girault, B., Renault, P.-O., Le Bourhis,E., Villain, P., Badawi, F., Castelnau, O., Brenner, R., Bechade, J.-L., Geandier, G., and Tamura, N. Sun . "Strains, stresses and elastic properties in polycrystallinemetallic thin films: in situ deformation combined with x-ray diffractionand simulation experiments". United States. doi:10.4028/www.scientific.net/MSF.524-525.735.
@article{osti_932790,
title = {Strains, stresses and elastic properties in polycrystallinemetallic thin films: in situ deformation combined with x-ray diffractionand simulation experiments},
author = {Goudeau, P. and Faurie, D. and Girault, B. and Renault, P.-O. and Le Bourhis,E. and Villain, P. and Badawi, F. and Castelnau, O. and Brenner, R. and Bechade, J.-L. and Geandier, G. and Tamura, N.},
abstractNote = {X-ray diffraction is used in combination with tensiletesting for measuring elastic properties of metallic thin films. Sizeeffect, elastic anisotropy and grain morphologies are considered in allthese experiments and supported by different kind of numericalsimulations operating at different length scales. Such instrumentalstudies are time consuming even if synchrotron sources are used. Newexperiments are under progress for reducing acquisition data andimproving precision on strain measurements. After introducing briefly themain principles and results of our techniques, first promisingmeasurements on nanometric W/Cu multilayers using 2D CCD detectors andhigh monochromatic flux at the Advanced Light Source Berkeley (USA) onbeam line 11.3.1 are presented. In addition, simulation experiments foranalyzing elasticity in textured gold film are discussed.},
doi = {10.4028/www.scientific.net/MSF.524-525.735},
journal = {Materials Science Forum},
number = ,
volume = 524-525,
place = {United States},
year = {Sun Dec 31 00:00:00 EST 2006},
month = {Sun Dec 31 00:00:00 EST 2006}
}