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Title: Symmetry Breaking in Few Layer Graphene Films

Abstract

Recently, it was demonstrated that the quasiparticledynamics, the layer-dependent charge and potential, and the c-axisscreening coefficient could be extracted from measurements of thespectral function of few layer graphene films grown epitaxially on SiCusing angle-resolved photoemission spectroscopy (ARPES). In this articlewe review these findings, and present detailed methodology for extractingsuch parameters from ARPES. We also present detailed arguments againstthe possibility of an energy gap at the Dirac crossing ED.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US); Advanced Light Source(ALS)
Sponsoring Org.:
USDOE Director. Office of Science. Basic EnergySciences
OSTI Identifier:
932485
Report Number(s):
LBNL-62955
R&D Project: 458111; BnR: KC0204016
DOE Contract Number:
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: New Journal of Physics; Journal Volume: 9; Journal Issue: 385; Related Information: Journal Publication Date: 10/2007
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; graphene

Citation Formats

Bostwick, A., Ohta, T., McChesney, J.L., Emtsev, K., Seyller,Th., Horn, K., and Rotenberg, E. Symmetry Breaking in Few Layer Graphene Films. United States: N. p., 2007. Web. doi:10.1088/1367-2630/9/10/385.
Bostwick, A., Ohta, T., McChesney, J.L., Emtsev, K., Seyller,Th., Horn, K., & Rotenberg, E. Symmetry Breaking in Few Layer Graphene Films. United States. doi:10.1088/1367-2630/9/10/385.
Bostwick, A., Ohta, T., McChesney, J.L., Emtsev, K., Seyller,Th., Horn, K., and Rotenberg, E. Fri . "Symmetry Breaking in Few Layer Graphene Films". United States. doi:10.1088/1367-2630/9/10/385. https://www.osti.gov/servlets/purl/932485.
@article{osti_932485,
title = {Symmetry Breaking in Few Layer Graphene Films},
author = {Bostwick, A. and Ohta, T. and McChesney, J.L. and Emtsev, K. and Seyller,Th. and Horn, K. and Rotenberg, E.},
abstractNote = {Recently, it was demonstrated that the quasiparticledynamics, the layer-dependent charge and potential, and the c-axisscreening coefficient could be extracted from measurements of thespectral function of few layer graphene films grown epitaxially on SiCusing angle-resolved photoemission spectroscopy (ARPES). In this articlewe review these findings, and present detailed methodology for extractingsuch parameters from ARPES. We also present detailed arguments againstthe possibility of an energy gap at the Dirac crossing ED.},
doi = {10.1088/1367-2630/9/10/385},
journal = {New Journal of Physics},
number = 385,
volume = 9,
place = {United States},
year = {Fri May 25 00:00:00 EDT 2007},
month = {Fri May 25 00:00:00 EDT 2007}
}
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