skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Composition Mapping of Co-Pt-Ti-O Perpendicular Magnetic Recording Media by Simultaneous EDS and EELS Spectrum Imaging

Abstract

For nearly a decade core-loss elemental mapping by energy-filtered transmission electron microscopy (EFTEM) with {approx}1 nm resolution has contributed greatly to the understanding of Co(Cr)-based thin-film longitudinal magnetic recording media for computer hard disks. Intergranular layers of non-ferromagnetic Cr-enriched material a few nanometers thick are critical for optimum performance since they decouple the magnetic exchange between grains allowing the magnetization within individual grains to be switched independently, as required for high-density recording of data. Modern perpendicular thin-film recording media, which allow higher recording densities than traditional longitudinal media, have a similar columnar grain structure with nonferromagnetic material separating and decoupling the grains. The present work involves plan-view TEM characterization of back-thinned Co-Pt media (Co/Pt{approx}4) with 6 levels of co-sputtered TiO{sub 2} from 0 to 43 vol%. The layer structure of the media was: polished Al substrate/6 nm seed layers/50 nm soft magnetic underlayer/14 nm Ru underlayer/12 nm Co-Pt-TiO{sub 2}/1 nm C overcoat.

Authors:
 [1];  [2];  [2]
  1. ORNL
  2. Stanford University
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Shared Research Equipment Collaborative Research Center
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
931891
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Microscopy and Microanalysis 2007, Fort Lauderdale, FL, USA, 20070805, 20070809
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; MAGNETIC DISKS; COBALT; PLATINUM; TITANIUM OXIDES; CHEMICAL COMPOSITION; ENERGY-LOSS SPECTROSCOPY; X-RAY SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; TEM; Spectrum Imaging; EDS; EELS; Composition Mapping; Recording Media; Thin Film; Co; Pt; TiO2

Citation Formats

Bentley, James, Risner, Juliet D., and Sinclair, Prof. Robert. Composition Mapping of Co-Pt-Ti-O Perpendicular Magnetic Recording Media by Simultaneous EDS and EELS Spectrum Imaging. United States: N. p., 2007. Web.
Bentley, James, Risner, Juliet D., & Sinclair, Prof. Robert. Composition Mapping of Co-Pt-Ti-O Perpendicular Magnetic Recording Media by Simultaneous EDS and EELS Spectrum Imaging. United States.
Bentley, James, Risner, Juliet D., and Sinclair, Prof. Robert. Mon . "Composition Mapping of Co-Pt-Ti-O Perpendicular Magnetic Recording Media by Simultaneous EDS and EELS Spectrum Imaging". United States. doi:.
@article{osti_931891,
title = {Composition Mapping of Co-Pt-Ti-O Perpendicular Magnetic Recording Media by Simultaneous EDS and EELS Spectrum Imaging},
author = {Bentley, James and Risner, Juliet D. and Sinclair, Prof. Robert},
abstractNote = {For nearly a decade core-loss elemental mapping by energy-filtered transmission electron microscopy (EFTEM) with {approx}1 nm resolution has contributed greatly to the understanding of Co(Cr)-based thin-film longitudinal magnetic recording media for computer hard disks. Intergranular layers of non-ferromagnetic Cr-enriched material a few nanometers thick are critical for optimum performance since they decouple the magnetic exchange between grains allowing the magnetization within individual grains to be switched independently, as required for high-density recording of data. Modern perpendicular thin-film recording media, which allow higher recording densities than traditional longitudinal media, have a similar columnar grain structure with nonferromagnetic material separating and decoupling the grains. The present work involves plan-view TEM characterization of back-thinned Co-Pt media (Co/Pt{approx}4) with 6 levels of co-sputtered TiO{sub 2} from 0 to 43 vol%. The layer structure of the media was: polished Al substrate/6 nm seed layers/50 nm soft magnetic underlayer/14 nm Ru underlayer/12 nm Co-Pt-TiO{sub 2}/1 nm C overcoat.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: