The Incorporation of Nanoscale Columnar Defects Comprised of Self-Assembled BaZrO3 Nanodots to Improve Flux-Pinning and Critical Current Density of NdBa2Cu3O7-δ Films Grown on RABiTS
- ORNL
We report significant enhancement in the flux-pinning of epitaxial NdBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (NdBCO) films on rolling-assisted biaxially textured substrates (RABiTS) via the incorporation of a two-dimensional array of columnar defects comprised of self-assembled BaZrO3 (BZO) nanodots. Pure NdBCO films and NdBCO films incorporating BZO nanodots, both with the same thickness of 0.6 {micro}m, were epitaxially grown on RABiTS by pulsed laser deposition. A very dense and homogeneous distribution of BZO nanodot columns with typical intercolumn spacing of around 15-20 nm oriented along the c-axis of the film was observed in the NdBCO+BZO film. Compared to the pure NBCO film on RABiTS, the NdBCO+BZO film on RABiTS has an in-field critical current density (J{sub c}) of a factor of more than 2 in 0.1-1.5 T and a smaller power-law exponent {alpha}{approx}0.21 in the field regime where J{sub c}{approx}H{sup -{alpha}}.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- OE USDOE - Office of Electric Transmission and Distribution
- DOE Contract Number:
- DE-AC05-00OR22725
- OSTI ID:
- 931750
- Journal Information:
- Superconductor Science & Technology, Vol. 20, Issue 8
- Country of Publication:
- United States
- Language:
- English
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