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Title: Substrate Surface Decoration With CeO2 Nanoparticles: An Effective Method for Improving Flux Pinning in YBa2Cu3O7 Films

Abstract

We have demonstrated improved critical current density, J{sub c}, in YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) films through a controlled study of substrate surface modifications with nano-sized second-phase pre-formed CeO{sub 2} particles. Nanoparticles were applied to single crystal SrTiO{sub 3} surfaces using suspension-based techniques prior to YBCO film growth. With the introduction of CeO{sub 2} nanoparticles, YBCO films showed more robust field dependence at intermediate fields (J{sub c} {infinity} B{sup -{infinity}}), where a smaller power law exponent of {alpha} {approx} 0.3 is obtained. The self-field J{sub c}(77 K, B{parallel}c) values of the YBCO films on reference and CeO{sub 2} modified substrates are 1.1 and 1.9 MA/cm2; and at 1 Tesla 0.1 and 0.52 MA/cm2, respectively. Consistent with this {alpha}-value, angular field dependent J{sub c} and transmission electron microscopy studies indicate the presence of c-axis aligned correlated defects in these modified samples.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [2];  [2];  [1];  [1]
  1. ORNL
  2. Columbia University
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
OE USDOE - Office of Electric Transmission and Distribution
OSTI Identifier:
931682
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Applied Superconductor Conference, Seattle, WA, USA, 20060827, 20060901
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; SUBSTRATES; SURFACE PROPERTIES; NANOSTRUCTURES; CERIUM OXIDES; CURRENT DENSITY; CRITICAL CURRENT; MAGNETIC FLUX; YTTRIUM OXIDES; BARIUM OXIDES; COPPER OXIDES

Citation Formats

Aytug, Tolga, Paranthaman, Mariappan Parans, Gapud, Albert Agcaoili, Kang, Sukill, Varela del Arco, Maria, Martin, Patrick M, Raitano, J. M., Chan, S. W., Thompson, James R, and Christen, David K. Substrate Surface Decoration With CeO2 Nanoparticles: An Effective Method for Improving Flux Pinning in YBa2Cu3O7 Films. United States: N. p., 2007. Web.
Aytug, Tolga, Paranthaman, Mariappan Parans, Gapud, Albert Agcaoili, Kang, Sukill, Varela del Arco, Maria, Martin, Patrick M, Raitano, J. M., Chan, S. W., Thompson, James R, & Christen, David K. Substrate Surface Decoration With CeO2 Nanoparticles: An Effective Method for Improving Flux Pinning in YBa2Cu3O7 Films. United States.
Aytug, Tolga, Paranthaman, Mariappan Parans, Gapud, Albert Agcaoili, Kang, Sukill, Varela del Arco, Maria, Martin, Patrick M, Raitano, J. M., Chan, S. W., Thompson, James R, and Christen, David K. Mon . "Substrate Surface Decoration With CeO2 Nanoparticles: An Effective Method for Improving Flux Pinning in YBa2Cu3O7 Films". United States. doi:.
@article{osti_931682,
title = {Substrate Surface Decoration With CeO2 Nanoparticles: An Effective Method for Improving Flux Pinning in YBa2Cu3O7 Films},
author = {Aytug, Tolga and Paranthaman, Mariappan Parans and Gapud, Albert Agcaoili and Kang, Sukill and Varela del Arco, Maria and Martin, Patrick M and Raitano, J. M. and Chan, S. W. and Thompson, James R and Christen, David K},
abstractNote = {We have demonstrated improved critical current density, J{sub c}, in YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) films through a controlled study of substrate surface modifications with nano-sized second-phase pre-formed CeO{sub 2} particles. Nanoparticles were applied to single crystal SrTiO{sub 3} surfaces using suspension-based techniques prior to YBCO film growth. With the introduction of CeO{sub 2} nanoparticles, YBCO films showed more robust field dependence at intermediate fields (J{sub c} {infinity} B{sup -{infinity}}), where a smaller power law exponent of {alpha} {approx} 0.3 is obtained. The self-field J{sub c}(77 K, B{parallel}c) values of the YBCO films on reference and CeO{sub 2} modified substrates are 1.1 and 1.9 MA/cm2; and at 1 Tesla 0.1 and 0.52 MA/cm2, respectively. Consistent with this {alpha}-value, angular field dependent J{sub c} and transmission electron microscopy studies indicate the presence of c-axis aligned correlated defects in these modified samples.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}

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