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Title: Characterization of Phase Evolution in YBCO Coated Conductors Produced by the Ex Situ BaF 2 Process

Abstract

Raman microprobe spectroscopy and scanning electron microscopy were used to study the initial nucleation and growth of YBCO in thick precursors by the BaF2 ex situ process. For quenched films of 2 mum thickness, the data indicate a low density of c-axis nuclei near the substrate, apparently due to a reduced oxygen concentration deep inside the precursor layer. Significant non c-axis growth was also observed; the majority of this material nucleates away from the substrate. Measurement of the conversion rate by in situ XRD for films in the range 0.2-2 {micro}m suggest a weak thickness dependence.

Authors:
 [1];  [1];  [1];  [1];  [2];  [2];  [3]
  1. ORNL
  2. Argonne National Laboratory (ANL)
  3. University of Wisconsin, Madison
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
OE USDOE - Office of Electric Transmission and Distribution
OSTI Identifier:
931681
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Applied Superconductor Conference, Seattle, WA, USA, 20060827, 20060901
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; YTTRIUM OXIDES; BARIUM OXIDES; COPPER OXIDES; NUCLEATION; CRYSTAL GROWTH; PRECURSOR; PHASE STUDIES

Citation Formats

Feenstra, Roeland, List III, Frederick Alyious, Zhang, Yifei, Christen, David K, Maroni, Victor A., Miller, D. J., and Feldmann, D. M. Characterization of Phase Evolution in YBCO Coated Conductors Produced by the Ex Situ BaF2 Process. United States: N. p., 2007. Web.
Feenstra, Roeland, List III, Frederick Alyious, Zhang, Yifei, Christen, David K, Maroni, Victor A., Miller, D. J., & Feldmann, D. M. Characterization of Phase Evolution in YBCO Coated Conductors Produced by the Ex Situ BaF2 Process. United States.
Feenstra, Roeland, List III, Frederick Alyious, Zhang, Yifei, Christen, David K, Maroni, Victor A., Miller, D. J., and Feldmann, D. M. Mon . "Characterization of Phase Evolution in YBCO Coated Conductors Produced by the Ex Situ BaF2 Process". United States. doi:.
@article{osti_931681,
title = {Characterization of Phase Evolution in YBCO Coated Conductors Produced by the Ex Situ BaF2 Process},
author = {Feenstra, Roeland and List III, Frederick Alyious and Zhang, Yifei and Christen, David K and Maroni, Victor A. and Miller, D. J. and Feldmann, D. M.},
abstractNote = {Raman microprobe spectroscopy and scanning electron microscopy were used to study the initial nucleation and growth of YBCO in thick precursors by the BaF2 ex situ process. For quenched films of 2 mum thickness, the data indicate a low density of c-axis nuclei near the substrate, apparently due to a reduced oxygen concentration deep inside the precursor layer. Significant non c-axis growth was also observed; the majority of this material nucleates away from the substrate. Measurement of the conversion rate by in situ XRD for films in the range 0.2-2 {micro}m suggest a weak thickness dependence.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}

Conference:
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