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Title: Polychromatic Microbeam Diffraction Characterization of Individual ZnO Nanostructures

Abstract

We have used the focused, polychromatic beam available at sector 34 of the APS to characterize the local lattice structure and perfection of several different forms of ZnO meso- and nano-structures. Using Kirkpatrick-Baez mirrors for white-beam focusing, we have developed scanning x-ray techniques capable of mapping the spatially-resolved lattice structure, strain and composition. Off-axis undulator radiation is routinely focused to ~0.5 mm and beams as small as 90 nm have been demonstrated. Laue diffraction patterns are collected using a CCD area detector, and computer analysis provides spatial maps of the crystal phase, grain orientations (texture), and the local strain tensor. We have demonstrated the ability to map the structure of individual meso- and nano-structures using ZnO fabricated in several different shapes: rods, belts and tapered styluses. TEM samples serve as ideal x-ray microdiffraction samples due to the low background signal. Even when mounted on a relatively-thick crystal substrate, full diffraction patterns can be measured from ZnO rods as narrow as 200 nm diameter. We find that all of the ZnO structures have a facetted, hexagonal crystal structure, with the c-axis often along the rod axis. Larger diameter rods are essentially perfect single crystals, wheras thinner rods show a high degreemore » of flexibility and hence large local mosaic spread along the rod axis. For stylus samples, the tapered region where the diameter decreases remains a single crystal.« less

Authors:
 [1];  [2];  [3];  [1];  [1];  [4];  [5];  [1];  [1]
  1. ORNL
  2. Carnegie Institution of Washington
  3. Argonne National Laboratory (ANL)
  4. University of Florida, Gainesville
  5. University of Florida
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
931447
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Fifth International Conference on Synchrotron Radiation in Materials Science (SRMS-5), Chicago, IL, USA, 20060730, 20060802
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 36 MATERIALS SCIENCE; CRYSTAL STRUCTURE; DIFFRACTION; GRAIN ORIENTATION; NANOSTRUCTURES; RADIATIONS; SYNCHROTRON RADIATION; WIGGLER MAGNETS

Citation Formats

Budai, John D, Yang, Wenge, Liu, W., Tischler, Jonathan Zachary, Pan, Zhengwei, Heo, YW, Norton, David P., Larson, Ben C, and Ice, Gene E. Polychromatic Microbeam Diffraction Characterization of Individual ZnO Nanostructures. United States: N. p., 2006. Web.
Budai, John D, Yang, Wenge, Liu, W., Tischler, Jonathan Zachary, Pan, Zhengwei, Heo, YW, Norton, David P., Larson, Ben C, & Ice, Gene E. Polychromatic Microbeam Diffraction Characterization of Individual ZnO Nanostructures. United States.
Budai, John D, Yang, Wenge, Liu, W., Tischler, Jonathan Zachary, Pan, Zhengwei, Heo, YW, Norton, David P., Larson, Ben C, and Ice, Gene E. Sun . "Polychromatic Microbeam Diffraction Characterization of Individual ZnO Nanostructures". United States. doi:.
@article{osti_931447,
title = {Polychromatic Microbeam Diffraction Characterization of Individual ZnO Nanostructures},
author = {Budai, John D and Yang, Wenge and Liu, W. and Tischler, Jonathan Zachary and Pan, Zhengwei and Heo, YW and Norton, David P. and Larson, Ben C and Ice, Gene E},
abstractNote = {We have used the focused, polychromatic beam available at sector 34 of the APS to characterize the local lattice structure and perfection of several different forms of ZnO meso- and nano-structures. Using Kirkpatrick-Baez mirrors for white-beam focusing, we have developed scanning x-ray techniques capable of mapping the spatially-resolved lattice structure, strain and composition. Off-axis undulator radiation is routinely focused to ~0.5 mm and beams as small as 90 nm have been demonstrated. Laue diffraction patterns are collected using a CCD area detector, and computer analysis provides spatial maps of the crystal phase, grain orientations (texture), and the local strain tensor. We have demonstrated the ability to map the structure of individual meso- and nano-structures using ZnO fabricated in several different shapes: rods, belts and tapered styluses. TEM samples serve as ideal x-ray microdiffraction samples due to the low background signal. Even when mounted on a relatively-thick crystal substrate, full diffraction patterns can be measured from ZnO rods as narrow as 200 nm diameter. We find that all of the ZnO structures have a facetted, hexagonal crystal structure, with the c-axis often along the rod axis. Larger diameter rods are essentially perfect single crystals, wheras thinner rods show a high degree of flexibility and hence large local mosaic spread along the rod axis. For stylus samples, the tapered region where the diameter decreases remains a single crystal.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}

Conference:
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