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Title: Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM


No abstract prepared.

 [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Shared Research Equipment Collaborative Research Center
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
DOE Contract Number:
Resource Type:
Resource Relation:
Conference: M&Ms 2006, Chicago, IL, USA, 20060730, 20060730
Country of Publication:
United States

Citation Formats

Kenik, Edward A, and Demers, Hendrix. Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM. United States: N. p., 2006. Web.
Kenik, Edward A, & Demers, Hendrix. Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM. United States.
Kenik, Edward A, and Demers, Hendrix. Sun . "Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM". United States. doi:.
title = {Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM},
author = {Kenik, Edward A and Demers, Hendrix},
abstractNote = {No abstract prepared.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}

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  • For nearly a decade core-loss elemental mapping by energy-filtered transmission electron microscopy (EFTEM) with {approx}1 nm resolution has contributed greatly to the understanding of Co(Cr)-based thin-film longitudinal magnetic recording media for computer hard disks. Intergranular layers of non-ferromagnetic Cr-enriched material a few nanometers thick are critical for optimum performance since they decouple the magnetic exchange between grains allowing the magnetization within individual grains to be switched independently, as required for high-density recording of data. Modern perpendicular thin-film recording media, which allow higher recording densities than traditional longitudinal media, have a similar columnar grain structure with nonferromagnetic material separating and decouplingmore » the grains. The present work involves plan-view TEM characterization of back-thinned Co-Pt media (Co/Pt{approx}4) with 6 levels of co-sputtered TiO{sub 2} from 0 to 43 vol%. The layer structure of the media was: polished Al substrate/6 nm seed layers/50 nm soft magnetic underlayer/14 nm Ru underlayer/12 nm Co-Pt-TiO{sub 2}/1 nm C overcoat.« less
  • No abstract prepared.