skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM

Abstract

No abstract prepared.

Authors:
 [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Shared Research Equipment Collaborative Research Center
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
931251
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: M&Ms 2006, Chicago, IL, USA, 20060730, 20060730
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; SCANNING ELECTRON MICROSCOPY; FIELD EMISSION; MICROANALYSIS; CALORIMETERS; SPECTRA

Citation Formats

Kenik, Edward A, and Demers, Hendrix. Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM. United States: N. p., 2006. Web.
Kenik, Edward A, & Demers, Hendrix. Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM. United States.
Kenik, Edward A, and Demers, Hendrix. Sun . "Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM". United States. doi:.
@article{osti_931251,
title = {Spectrum Imaging with a Microcalorimeter EDS Detector on a FEG-SEM},
author = {Kenik, Edward A and Demers, Hendrix},
abstractNote = {No abstract prepared.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share:
  • Analysis of boron in waste glasses and in the reaction products that form during the reaction of glass is important for understanding the reaction kinetics and mechanism of glass corrosion. Two borosilicate waste glasses (1.55 and 3.47 wt% B) have been analyzed by SEM/EDS. The 1.55 wt% is the lowest B concentration detected with EDS. However, the B peaks severely overlap with the C peaks due to the carbon films used for conductive layers, but this problem can be solved by subtracting the C peaks, and possibly even lower B content could be detected by EDS with the digital pulsemore » processor.« less
  • Crystallographic information can be determined for bulk specimens in a SEM by utilizing electron backscatter diffraction (EBSD), which is also referred to as backscatter electron Kikuchi diffraction. This technique provides similar information to that provided by selected area electron channeling (SAEC). However, the spatial resolutions of the two techniques are limited by different processes. In SAEC patterns, the spatial resolution is limited to {approximately}2 {mu}m by the motion of the beam on the specimen, which results from the angular rocking of the beam and the aberration of the probe forming lens. Therefore, smaller incident probe sizes provide no improvement inmore » spatial resolution of SAEC patterns. In contrast, the spatial resolution for EBSD, which uses a stationary beam and an area detector, is determined by (1) the incident probe size and (2) the size of the interaction volume from which significant backscattered electrons are produced in the direction of the EBSD detector. The second factor is influenced by the accelerating voltage, the specimen tilt, and the relative orientation of scattering direction and the specimen tilt axis. This study was performed on a Philips XL30/FEG SEM equipped with a TexSEM Orientation Imaging Microscopy (OIM) system. The signal from the EBSD detector (SIT camera) is flat- fielded and enhanced in a MTI frame storage/image processor. The Schottky FEG source provides the fine probe sizes ({approximately}10 nm) desired with sufficient probe current ({approximately}1 nA) needed for image processing with the low signal/noise EBSD signal.« less
  • For nearly a decade core-loss elemental mapping by energy-filtered transmission electron microscopy (EFTEM) with {approx}1 nm resolution has contributed greatly to the understanding of Co(Cr)-based thin-film longitudinal magnetic recording media for computer hard disks. Intergranular layers of non-ferromagnetic Cr-enriched material a few nanometers thick are critical for optimum performance since they decouple the magnetic exchange between grains allowing the magnetization within individual grains to be switched independently, as required for high-density recording of data. Modern perpendicular thin-film recording media, which allow higher recording densities than traditional longitudinal media, have a similar columnar grain structure with nonferromagnetic material separating and decouplingmore » the grains. The present work involves plan-view TEM characterization of back-thinned Co-Pt media (Co/Pt{approx}4) with 6 levels of co-sputtered TiO{sub 2} from 0 to 43 vol%. The layer structure of the media was: polished Al substrate/6 nm seed layers/50 nm soft magnetic underlayer/14 nm Ru underlayer/12 nm Co-Pt-TiO{sub 2}/1 nm C overcoat.« less
  • No abstract prepared.